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Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

Variation in electrical resistance versus strain of an individual multiwalled carbon nanotube

(4) Jang, Hoon Sik a Lee, Yun Hee b Na, Ho Jun b Nahm, Seung Hoon b

a The University of Texas at Dallas (United States)

b Korea Research Institute of Standards and Science (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

GAGES; MULTIWALLED CARBON NANOTUBES (MWCN); NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOTUBES; SCANNING ELECTRON MICROSCOPY; TUNGSTEN;

APPLICATIONS.; CARBON DEPOSITIONS; ELECTRICAL RESISTANCES; ELONGATION PROCESSES; MECHANICAL STRAINS; MICROMECHANICAL DEVICES; NANO MATERIALS; SCANNING ELECTRON MICROSCOPES; SENSING FORCES; STRAIN GAUGES; STRAIN SENSING; STRAIN SENSITIVITIES; TUBE FRACTURES; TUNGSTEN TIPS;

CARBON NANOTUBES;

EID: 58149216155 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3032905 Document Type: Article

Times cited : (17)

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