Electrical and raman spectroscopic studies of vertically aligned multi-walled carbon nanotubes

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 7, 2009, Pages 4392-4396

  Mathur, Ashish ^a   Tweedie, Mark ^a   Roy, Susanta Sinha ^a   Maguire, P D ^a   McLaughlin, James A ^a  

^a UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

Carbon nanotubes; Electrical properties; Raman spectroscopy

Indexed keywords

CNT FILMS; COBALT THIN FILMS; ELECTRICAL PROPERTIES; ELECTRICAL RESISTIVITY; MICROWAVE PLASMA; NANOTUBE GROWTH; RAMAN SPECTROSCOPIC STUDY; SILICON SUBSTRATES; SUBSTRATE TEMPERATURE; TEMPERATURE DEPENDENT; VERTICALLY ALIGNED;

ACTIVATION ENERGY; CARBON FILMS; CARBON NANOTUBES; COBALT; ELECTRIC CONDUCTIVITY; MICROWAVES; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PLASMAS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

MULTIWALLED CARBON NANOTUBES (MWCN);

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; RAMAN SPECTROMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 70350309791     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.M66     Document Type: Conference Paper

References (21)

1. S. Iijima, Nature 354, 56 (1991).
2. W. B. Choi, D. S. Chung, J. H. Kang, H. Y. Kim, Y. W. Jin, and I. T. Han, Appl. Phys. Lett. 75, 3129 (1999).
3. S. Fan, M. G. Chapline, N. F. Franklin, T. W. Tombler, A. M. Cassel, and H. Dai, Science 283, 512 (1999).
4. P. G. Collins and A. Zwttl, Phys. Rev. B 55, 9391 (1997).
5. A. C. Dillon, A. H. Mahan, P. A. Parilla, J. L. Alleman, M. J. Heben, K. M. Jones, and K. E. H. Gilbert, Nano Lett. 3, 1425 (2003).
6. S. Thongtem, P. Singjai, T. Thongtem, and S. Preyachoti, Mater. Sex. Eng. A 423, 209 (2006).
7. Z. F. Ren, Z. P. Huang, J. W. Xu, J. H. Wang, P. Bush, M. P. Siegal, and P. N. Provencio, Science 282, 1105 (1998).
8. O. M. Kuttel, O. Groening, C. Emmenegger, and L. Schlapbach, Appl. Phys. Lett. 73, 2113 (1998).
9. M. S. Dresselhaus, G. Dresselhaus, and P. C. Eklund, Science of Fullerenes and Carbon Nanotubes, Academic Press, New York (1996).
10. J. W. G. Wildoer, L. C. Venema, A. G. Rinzler, R. E. Smaliey, and C. Dekker, Nature 59, 391 (1998).
11. R. Martel, T. Schmidt, H. R. Shea, T. Hertel, and Ph. Avouris, Appl. Phys. Lett. 73, 17 (1998).
12. M. Bockrath, D. H. Cobden, J. Lu, A. G. Rinzler, R. E. Smaliey, L. Balents, and P. L. McEuen, Nature 397, 598 (1999).
13. M. Chhowalla, K. B. K. Teo, C. Ducati, N. L. Rupesinghe, G. A. J. Amaratunga, A. C. Ferrari, D. Roy, J. Robertson, and W. I. Milne, J. Appl. Phys. 90, 5308 (2001).
14. F. Tuinstra and J. L. Koenig, J. Chem. Phys. 53, 1126 (1970).
15. H. Wilhelm, M. Lelaurain, E. McRae, and B. Humbert, J. Appl. Phys. 84, 6552 (1998).
16. M. S. Dresselhaus, M. A. Pimenta, P. C. Eklund, and G. Dresselhaus, Raman Scattering in Material Science, edited by W. H. Weber and R. Merlin, Springer, Berlin (2000), p. 314.
17. C. Schonenberger, A. Bachtold, C. Strunk, J.-P. Salvetat, and L. Forro, Appl. Phys. A 69, 283 (1999).
18. L. Forro and C. Schnonenberger, Carbon Nanotubes, edited by M. S. Dresselhaus, G. Dresselhaus, and Ph. Avouris, Springer, Berlin/Heidelberg (2001), p. 329.
19. A. Thess, R. Lee, P. Nikolaev, H. J. Dai, P. Petit, J. Robert, C. H. Xu, Y. H. Lee, S. G. Kim, A. G. Rinzler, D. T. Colbert, G. E. Scuseria, D. Tomanek, J. E. Fischer, and R. E. Smalley, Science 273,483 (1996).
20. S. B. Lee, K. B. K. Teo, M. Chhowalla, D. G. Hasko, G. A. J. Amaratunga, W. I. Milne, and H. Ahmed, Microelectron. Eng. 475, 61 (2002).
21. T. W. Ebbesen, H. J. Lezec, H. Hiura, J. W. Bennett, H. F. Ghaemi, and T. Thio, Nature 382, 54 (1996).