Cobalt valence and crystal structure of La0.5Sr0.5CoO2.25

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 77, Issue 1, 1998, Pages 49-65

  Wang, Z L ^a   Yin, J S ^a  

^a Georgia Institute of Technology ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; OXYGEN; PEROVSKITE; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

ANION DEFICIENCY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; OXYGEN VACANCIES;

LANTHANUM COMPOUNDS;

EID: 0031699266     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819808206382     Document Type: Article

References (27)

1. Anderson, P. W., and Hasegawa, H., 1955, Phys. Rev., 100, 675.
2. Briceno, G., Xiang, X.-D., Change, H., Sun, X., and Schultz, P. G., 1995, Science, 270, 273.
3. Buseck, P., Cowley, J., and Eyring, L. (editor), 1989, High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford University Press).
4. Chahara, K., Ohno, T., Kasai, M., and Kozono, Y., 1993, Appl. Phys. Lett., 63, 1990.
5. deGennes, P. G., 1960, Phys. Rev., 118, 141.
6. Egerton, R. F., 1996, Electron Energy-Loss Spectroscopy in the Electron Microscopy, Second edition (New York: Plenum).
7. c Superconductors (New York: Gordon and Breach).
8. Jin, J., Tiefel, T. H., McCormack, M., Fatnacht, R. A., Ramech, R., and Chen, F. H., 1994, Science, 264, 413.
9. Jonker, J. H., and van Santen, G. H., 1953, Physica, 19, 120.
10. Ju, H. L., Kwon, C., Greenne, R. L., and Venkatessan, T., 1994, Appl. Phys. Lett., 65, 2108.
11. Kurata, H., and Colliex, C., 1993, Phys. Rev. B, 48, 2102.
12. Fi, Y. Q., Zhang, J., Pombrik, S., DiMascio, S., Stevens, W., Yan, Y. F., and Ong, N. P., 1995, J. Mater. Res., 10, 2166.
13. Floyd, S. J., Botton, G. A., and Stobbs, W. M., 1995, J. Microsc., 180, 288.
14. Pearson, D. H., Ahn, C. C., and Fultz, B., 1993, Phys. Rev. B, 47, 8471.
15. Pearson, D. H., Fultz, B., and Ahn, C. C., 1988, Appl. Phys. Lett., 53, 1405.
16. Prinz, G. A., 1995, Phys. Today, April, 58.
17. Rask, J. H., Mine, B. A., and Buseck, P. R., 1987, Ultramicroscopy, 32, 319.
18. Senaris-Rodriguez, M. A., and Goodenough, J. B., 1995, J. solid-st. Chem., 118, 323.
19. Von Helmolt, R., Wecker, J., Holzapfel, B., Schultz, F., and Samwer, K., 1994, Phvs. Rev. Lett., 71, 2331.
20. Wang, Z. L., and Kang, Z. C., 1997, Functional and Smart Materials—Structural Evolution and Structure Analysis (New York, Plenum).
21. Wang, Z. L., Yin, J. S., Jiang, Y. D., and Zhang, J., 1997, Appl. Phys. Lett., 70, 3362.
22. Wang, Z. F., and Zhang, J., 1996, Phys. Rev. B, 54, 1153.
23. Wang, Z. F., Zhang, J., and Berta, Y., 1996, Epitaxial Oxide Thin Films II, Materials Reseach Society Symposium Proceedings, Vol. 401, edited by J. S. Speck, D. K. Fork, R. M. Wolf, and T. Shiosaki (Pittsburg, Pennsylvania: Materials Research Society), p. 91.
24. Yuan, J., Gu, E., Gester, M., Bland, J. A. C., and Brown, L. M., 1994, J. appl. Phvs., 75, 6501.
25. Zener, C., 1951, Phys. Rev., 82, 403.
26. Zhang, J., Cui, G. J., Gordon, D., Van Buskirs, P., and Steinbeck, J., 1993, Ferroelectric-Thin Films III, Materials Research Society Symposium Proceedings, Vol. 310, edited by E. R. Myers, B. A. Tuttle, S. B. Desu and P. K. Larsen (Pittsburg, Pennsylvania: Materials Research Society), p. 249.
27. Zhang, J., Gardiner, R. A., Kirlin, P. S., Boerstler, R. W., and Steinbeck, J., 1992, Appl. Phys. Lett., 61, 2884.