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Volumn , Issue , 2011, Pages

A manufacturable, high power RF Gallium Nitride (GaN) technology portfolio with 65V operation and enhanced linearity

Author keywords

GaN HEMT; high efficiency; high voltage; intermodulation distortion; power amplifier

Indexed keywords

GAN HEMTS; HIGH VOLTAGE; HIGH-POWER; LINEAR TECHNOLOGIES; OUTPUT POWER; RELIABLE OPERATION; RF TECHNOLOGY; RF-POWER; TECHNOLOGY PORTFOLIOS;

EID: 84855784858     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COMCAS.2011.6105956     Document Type: Conference Paper
Times cited : (9)

References (11)
  • 2
    • 33750930174 scopus 로고    scopus 로고
    • A 500W push-pull AlGaN/GaN HEMT amplifier for L-band high power application
    • June
    • Maekawa et al., "A 500W Push-Pull AlGaN/GaN HEMT Amplifier for L-Band High Power Application," 2006 IEEE International Microwave Symposium Digest, pp. 722-725, June 2006.
    • (2006) 2006 IEEE International Microwave Symposium Digest , pp. 722-725
    • Maekawa1
  • 3
    • 77957766979 scopus 로고    scopus 로고
    • 100 W GaN HEMT power amplifier module with > 60% efficiency over 100-1000 MHz bandwidth
    • May
    • Krishnamurthy et al., "100 W GaN HEMT power amplifier module with > 60% efficiency over 100-1000 MHz bandwidth," 2010 IEEE International Microwave Symposium Digest, pp. 940-943, May 2010.
    • (2010) 2010 IEEE International Microwave Symposium Digest , pp. 940-943
    • Krishnamurthy1
  • 4
    • 84855784016 scopus 로고    scopus 로고
    • JEDEC standard 91A
    • "JESD91A" - JEDEC standard 91A.
    • JESD91A
  • 6
    • 70449133497 scopus 로고    scopus 로고
    • Reliability of GaN HEMTs: Current status and future technology
    • Apeil
    • Ohki et al., "Reliability of GaN HEMTs: current status and future technology," 2009 IEEE International Reliability Physics Symposium, pp. 61-70, Apeil 2009.
    • (2009) 2009 IEEE International Reliability Physics Symposium , pp. 61-70
    • Ohki1
  • 7
    • 80052310353 scopus 로고    scopus 로고
    • A 65 % drain efficiency GaN HEMT with 200 W peak power for 20 v to 65 v envelope tracking base station amplifier
    • June
    • Yamaki et al., "A 65 % drain efficiency GaN HEMT with 200 W peak power for 20 V to 65 V envelope tracking base station amplifier," 2011 IEEE International Microwave Symposium Digest, pp. 1-4, June 2011.
    • (2011) 2011 IEEE International Microwave Symposium Digest , pp. 1-4
    • Yamaki1
  • 8
    • 34748867887 scopus 로고    scopus 로고
    • Degradation-mode analysis for highly reliable GaN-HEMT
    • June
    • Inoue, "Degradation-Mode Analysis for Highly Reliable GaN-HEMT," 2007 IEEE International Microwave Symposium Digest, pp. 639-642, June 2007.
    • (2007) 2007 IEEE International Microwave Symposium Digest , pp. 639-642
    • Inoue1
  • 9
    • 84855761421 scopus 로고    scopus 로고
    • www.rfmd.com/foundry/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.