High-efficiency automated nanomanipulation with parallel imaging/manipulation force microscopy

IEEE Transactions on Nanotechnology

Volumn 11, Issue 1, 2012, Pages 21-33

  Xie, Hui ^a   Régnier, Stéphane ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

Atomic force microscope (AFM); automated; high efficiency; nanoparticle push; parallel nanomanipulation

Indexed keywords

AFM-BASED NANOMANIPULATION; ATOMIC FORCE MICROSCOPES; AUTOMATED; AUTOMATED NANOMANIPULATION; BIOMANIPULATION; DYNAMIC IMAGE PROCESSING; FORCE MICROSCOPY; HIGH SPEED IMAGE; IMAGE SCANNING; IMAGING SENSORS; MULTI-THREAD; NANO-CHARACTERIZATION; NANOMANIPULATIONS; PARALLEL IMAGING; PARALLEL MANIPULATIONS; PARALLEL NANOMANIPULATION; PUSHING MANIPULATION; SYSTEM CONTROL; TASK PLANNING;

AUTOMATION; EFFICIENCY; IMAGE PROCESSING; MICROMANIPULATORS; MICROSCOPES; NANOCANTILEVERS; NANOPARTICLES; NANOTECHNOLOGY; NANOTUBES; NANOWIRES;

ATOMIC FORCE MICROSCOPY;

EID: 84855669397     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2010.2041359     Document Type: Article

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