Manipulation of gold nanoparticles in liquid environments using scanning force microscopy

Ultramicroscopy

Volumn 82, Issue 1-4, 2000, Pages 135-139

  Resch, R ^a   Lewis, D ^a   Meltzer, S ^a   Montoya, N ^a   Koel, B E ^a   Madhukar, A ^a   Requicha, A A G ^a   Will, P ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

AFM; Liquid; MAC mode atomic force microscopy; Nanomanipulation; Nanoparticle; Scanning force microscopy; SFM

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ETHANOL; NANOSTRUCTURED MATERIALS; ORGANIC SOLVENTS; SILICA; SILICON; SURFACE PHENOMENA; WATER;

NANOMANIPULATION; SCANNING FORCE MICROSCOPY;

GOLD;

ALCOHOL; GOLD; NANOPARTICLE; SILICON; SILICON DIOXIDE; WATER;

ANALYTIC METHOD; ARTICLE; CHEMICAL MODIFICATION; REACTION ANALYSIS; SCANNING FORCE MICROSCOPY; TECHNIQUE;

EID: 0033984730     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00152-7     Document Type: Article

References (15)

1. A.A.G. Requicha, J. Nanoparticle Res. (1999) in press.
2. Andres R.P., Bielefeld J.D., Henderson J.L., Janes D.B., Kolagunta V.R., Kubiak C.P., Mahoney W.J., Osifchin R.G. Science. 273:1996;1690.
3. Vijaya Sarathy K., Raina G., Yadev R.T., Kulkarni G.U., Rao C.N.R. J. Phys. Chem. B. 101:1997;9876.
4. Ohara P.C., Heath J.R., Gelbart W.M. Angew. Chemie Int. Ed. Engl. 36:1997;1077.
5. Schaefer D.M., Reifenberger R., Patil A., Andres R.P. Appl. Phys. Lett. 66:1995;1012.
6. Junno T., Deppert K., Montelius L., Samuelson L. Appl. Phys. Lett. 66:1995;3627.
7. Baur C., Gazen B.C., Koel B.E., Ramachandran T.R., Requicha A.A.G., Zini L. J. Vac. Sci. Technol. B. 15:1997;1577.
8. Resch R., Baur C., Bugacov A., Gazen B.C., Koel B.E., Madhukar A., Ramachandran T.R., Requicha A.A.G., Will P. Appl. Phys. A. 67:1998;265.
9. Baur C., Bugacov A., Koel B.E., Madhukar A., Montoya N., Ramachandran T.R., Requicha A.A.G., Resch R., Will P. Nanotechnology. 9:1998;360.
10. Resch R., Bugacov A., Baur C., E Koel B., Madhukar A., Requicha A.A.G., Will P. Langmuir. 14:1998;6613.
11. Resch R., Baur C., Bugacov A., Koel B.E., Echternach P.M., Madhukar A., Montoya N., Requicha A.A.G., Will P. J. Phys. Chem. B. 103:1999;3647.
12. Yamada H., Akamine S., Quate C.F. Ultramicroscopy. 42-44:1992;1044.
13. Mueller D.J., Schabert F.A., Bueldt G., Engel A. Biophys. J. 68:1995;1681.
14. Shibata-Seki T., Masai J., Tagawa T., Sorin T., Kondo S. Thin Solid Films. 273:1996;297.
15. A. Bugacov, R. Resch, C. Baur, N. Montoya, K. Woronowicz, A. Papson, B.E. Koel, A.A.G. Requicha, P. Will, Probe Microsc. (1999) in press.