Effect of self-assembled monolayers on charge injection and transport in poly(3-hexylthiophene)-based field-effect transistors at different channel length scales

ACS Applied Materials and Interfaces

Volumn 3, Issue 8, 2011, Pages 2973-2978

  Singh, K A ^a   Nelson, T L ^b   Belot, J A ^b   Young, T M ^b   Dhumal, N R ^b   Kowalewski, T ^b   McCullough, R D ^b   Nachimuthu, P ^c   Thevuthasan, S ^c   Porter, L M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

charge mobility; organic field effect transistors; photoelectron spectroscopy; self assembled monolayers

Indexed keywords

BOTTOM-CONTACT; CHANNEL LENGTH; CHARGE MOBILITIES; CHEMICAL COMPOSITIONS; CONTACT METAL WORK FUNCTIONS; ELECTRON-RICH; ELECTRONWITHDRAWING; FIELD-EFFECT MOBILITIES; LONG CHANNEL DEVICES; METAL WORK FUNCTION; POLAR MOLECULES; POLY (3-HEXYLTHIOPHENE); RR-P3HT; SAMS; SHORT-CHANNEL DEVICES; SOURCE AND DRAINS;

CARRIER MOBILITY; ELECTRONS; MESFET DEVICES; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; TRANSISTORS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; WORK FUNCTION;

SELF ASSEMBLED MONOLAYERS;

GOLD; POLY(3 HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE); THIOPHENE DERIVATIVE;

ARTICLE; CHEMISTRY; ELECTRON; SEMICONDUCTOR;

ELECTRONS; GOLD; THIOPHENES; TRANSISTORS, ELECTRONIC;

EID: 84855174911     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am200449x     Document Type: Article

References (47)

1. Clemens, W.; Fix, I.; Ficker, J.; Knobloch, A.; Ullmann, A. J. Mater. Res. 2004, 19, 1963-1973
2. Bao, Z. N. Adv. Mater. 2000, 12, 227-230
3. Organic Electronics: Materials, Manufacturing and Applications; Klauk, H., Ed.; WILEY-VCH Verlag GmbH & Co. KGaA: Weinheim, Germany, 2006.
4. Katz, H. E.; Huang, J. Annu. Rev. Mater. Res. 2009, 39, 71-92
5. Osaka, I.; McCullough, R. D. Acc. Chem. Res. 2008, 41, 1202-1214
6. Horowitz, G. Adv. Mater. 1998, 10, 365-377
7. Sirringhaus, H. Adv. Mater. 2005, 17, 2411-2425
8. Meijer, E. J.; Gelinck, G. H.; van Veenendaal, E.; Huisman, B. H.; de Leeuw, D. M.; Klapwijk, T. M. Appl. Phys. Lett. 2003, 82, 4576-4578
9. Hamadani, B. H.; Natelson, D. Appl. Phys. Lett. 2004, 84, 443-445
10. Burgi, L.; Richards, T. J.; Friend, R. H.; Sirringhaus, H. J. Appl. Phys. 2003, 94, 6129-6137
11. Singh, K. A.; Young, T.; McCullough, R. D.; Kowalewski, T.; Porter, L. M. Adv. Funct. Mater. 2010, 20, 2216-2221
12. Singh, K. A.; Sauve, G.; Zhang, R.; Kowalewski, T.; McCullough, R. D.; Porter, L. M. Appl. Phys. Lett. 2008, 92, 263303
13. Hirose, Y.; Kahn, A.; Aristov, V.; Soukiassian, P.; Bulovic, V.; Forrest, S. R. Phys. Rev. B 1996, 54, 13748-13758
14. Hwang, J.; Wan, A.; Kahn, A. Mater. Sci. Eng., R 2009, 64, 1-31
15. Liu, Z. H.; Kobayashi, M.; Paul, B. C.; Bao, Z. N.; Nishi, Y. Phys. Rev. B 2010, 82, 035311
16. Hamadani, B. H.; Natelson, D. J. Appl. Phys. 2005, 97, 064508
17. Stadlober, B.; Haas, U.; Gold, H.; Haase, A.; Jakopic, G.; Leising, G.; Koch, N.; Rentenberger, S.; Zojer, E. Adv. Funct. Mater. 2007, 17, 2687-2692
18. Hong, K.; Yang, S. Y.; Yang, C.; Kim, S. H.; Choi, D.; Park, C. E. Org. Electron. 2008, 9, 864-868
19. Campbell, I. H.; Kress, J. D.; Martin, R. L.; Smith, D. L.; Barashkov, N. N.; Ferraris, J. P. Appl. Phys. Lett. 1997, 71, 3528-3530
20. Khodabakhsh, S.; Poplavskyy, D.; Heutz, S.; Nelson, J.; Bradley, D. D. C.; Murata, F.; Jones, T. S. Adv. Funct. Mater. 2004, 14, 1205-1210
21. Ulman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly; Academic Press: San Diego, CA, 1991.
22. Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103-1169
23. Hamadani, B. H.; Corley, D. A.; Ciszek, J. W.; Tour, J. M.; Natelson, D. Nano Lett. 2006, 6, 1303-1306
24. DiBenedetto, S. A.; Facchetti, A.; Ratner, M. A.; Marks, T. J. Adv. Mater. 2009, 21, 1407-1433
25. Asadi, K.; Wu, Y.; Gholamrezaie, F.; Rudolf, P.; Blom, P. W. M. Adv. Mater. 2009, 21, 4109-4114
26. Rissner, F.; Rangger, G. M.; Hofmann, O. T.; Track, A. M.; Heimel, G.; Zojer, E. ACS Nano 2009, 3, 3513-3520
27. de Boer, B.; Hadipour, A.; Mandoc, M. M.; van Woudenbergh, T.; Blom, P. W. M. Adv. Mater. 2005, 17, 621-625
28. Alloway, D. M.; Hofmann, M.; Smith, D. L.; Gruhn, N. E.; Graham, A. L.; Colorado, R.; Wysocki, V. H.; Lee, T. R.; Lee, P. A.; Armstrong, N. R. J. Phys. Chem. B 2003, 107, 11690-11699
29. Zehner, R. W.; Parsons, B. F.; Hsung, R. P.; Sita, L. R. Langmuir 1999, 15, 1121-1127
30. Cheng, X.; Noh, Y.-Y.; Wang, J.; Tello, M.; Frisch, J.; Blum, R.-P.; Vollmer, A.; Rabe, J. P.; Koch, N.; Sirringhaus, H. Adv. Funct. Mater. 2009, 19, 2407-2415
31. Chen, W.; Gao, X. Y.; Qi, D. C.; Chen, S.; Chen, Z. K.; Wee, A. T. S. Adv. Funct. Mater. 2007, 17, 1339-1344
32. Kline, R. J.; Mcgehee, M. D.; Toney, M. F. Nat. Mater. 2006, 5, 222-228
33. Alloway, D. M.; Graham, A. L.; Yang, X.; Mudalige, A.; Colorado, R.; Wysocki, V. H.; Pemberton, J. E.; Lee, T. R.; Wysocki, R. J.; Armstrong, N. R. J. Phys. Chem. C 2009, 113, 20328-20334
34. Schlaf, R.; Schroeder, P. G.; Nelson, M. W.; Parkinson, B. A.; Lee, P. A.; Nebesny, K. W.; Armstrong, N. R. J. Appl. Phys. 1999, 86, 1499-1509
35. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Montgomery, J. A., Jr.; Vreven, T.; Kudin, K. N.; Burant, J. C.; Millam, J. M.; Iyengar, S. S.; Tomasi, J.; Barone, V.; Mennucci, B.; Cossi, M.; Scalmani, G.; Rega, N.; Petersson, G. A.; Nakatsuji, H.; Hada, M.; Ehara, M.; Toyota, K.; Fukuda, R.; Hasegawa, J.; Ishida, M.; Nakajima, T.; Honda, Y.; Kitao, O.; Nakai, H.; Klene, M.; Li, X.; Knox, J. E.; Hratchian, H. P.; Cross, J. B.; Bakken, V.; Adamo, C.; Jaramillo, J.; Gomperts, R.; Stratmann, R. E.; Yazyev, O.; Austin, A. J.; Cammi, R.; Pomelli, C.; Ochterski, J. W.; Ayala, P. Y.; Morokuma, K.; Voth, G. A.; Salvador, P.; Dannenberg, J. J.; Zakrzewski, V. G.; Dapprich, S.; Daniels, A. D.; Strain, M. C.; Farkas, O.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Ortiz, J. V.; Cui, Q.; Baboul, A. G.; Clifford, S.; Cioslowski, J.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Gonzalez, C.; Pople, J. A. Gaussian 03, revision D.01; Gaussian, Inc.: Wallingford, CT, 2004.
36. Gundlach, D. J.; Royer, J. E.; Park, S. K.; Subramanian, S.; Jurchescu, O. D.; Hamadani, B. H.; Moad, A. J.; Kline, R. J.; Teague, L. C.; Kirillov, O.; Richter, C. A.; Kushmerick, J. G.; Richter, L. J.; Parkin, S. R.; Jackson, T. N.; Anthony, J. E. Nat. Mater. 2008, 7, 216-221
37. Hamadani, B. H.; Richter, C. A.; Gundlach, D. J.; Kline, R. J.; McCulloch, I.; Heeney, M. J. Appl. Phys. 2007, 102, 044503
38. Hamadani, B. H.; Gundlach, D. J.; McCulloch, I.; Heeney, M. Appl. Phys. Lett. 2007, 91, 3
39. Burgi, L.; Friend, R. H.; Sirringhaus, H. Appl. Phys. Lett. 2003, 82, 1482-1484
40. Salleo, A.; Kline, R. J.; DeLongchamp, D. M.; Chabinyc, M. L. Adv. Mater. 2010, 22, 3812-3838
41. Blom, P. W. M.; deJong, M. J. M.; vanMunster, M. G. Phys. Rev. B 1997, 55, R656-R659
42. Frenkel, J. Phys. Rev. 1938, 54, 647-648
43. Zhang, R.; Li, B.; Iovu, M. C.; Jeffries-El, M.; Sauve, G.; Cooper, J.; Jia, S. J.; Tristram-Nagle, S.; Smilgies, D. M.; Lambeth, D. N.; McCullough, R. D.; Kowalewski, T. J. Am. Chem. Soc. 2006, 128, 3480-3481
44. Bjornholm, T.; Greve, D. R.; Reitzel, N.; Hassenkam, T.; Kjaer, K.; Howes, P. B.; Larsen, N. B.; Bogelund, J.; Jayaraman, M.; Ewbank, P. C.; McCullough, R. D. J. Am. Chem. Soc. 1998, 120, 7643-7644
45. Nelson, T. L. Ph.D, University of South Carolina, Columbia, SC, 2007.
46. Loewe, R. S.; Khersonsky, S. M.; McCullough, R. D. Adv. Mater. 1999, 11, 250-253
47. Loewe, R. S.; Ewbank, P. C.; Liu, J. S.; Zhai, L.; McCullough, R. D. Macromolecules 2001, 34, 4324-4333