Planarization of polymeric field-effect transistors: Improvement of nanomorphology and enhancement of electrical performance

Advanced Functional Materials

Volumn 20, Issue 14, 2010, Pages 2216-2221

  Singh, Kumar A ^a   Young, Tomasz ^b   McCullough, Richard D ^b   Kowaiewski, Tomasz ^b   Porter, Lisa M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROGRAPHS; BOTTOM-CONTACT; CHANNEL LENGTH; CHARGE TRANSPORT; CONTACT EDGES; CONTACT GEOMETRY; DIRECT VISUALIZATION; DROP-CASTING; ELECTRICAL PERFORMANCE; IN-FIELD; NANO-FIBRILS; NANOMORPHOLOGIES; PLANARIZATION; POLY(3-HEXYLTHIOPHENE); POLYMER MORPHOLOGY; REGIO-REGULAR; RR-P3HT; SHORT CHANNELS;

ATOMIC FORCE MICROSCOPY; GATE DIELECTRICS; GATES (TRANSISTOR); GRAIN BOUNDARIES; MORPHOLOGY; ORGANIC FIELD EFFECT TRANSISTORS; POLYMERS; VISUALIZATION;

FIELD EFFECT TRANSISTORS;

EID: 77955405530     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201000346     Document Type: Article

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