In situ gas-phase hydrosilylation of plasma-synthesized silicon nanocrystals

ACS Applied Materials and Interfaces

Volumn 3, Issue 8, 2011, Pages 3033-3041

  Jariwala, Bhavin N ^a   Dewey, Oliver S ^a   Stradins, Paul ^b   Ciobanu, Cristian V ^a   Agarwal, Sumit ^a  

^a Department of Geology and Geological Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

hydrosilylation; silicon nanocrystals; surface functionalization

Indexed keywords

1-ALKENES; ATTENUATED TOTAL REFLECTIONS; FOURIER TRANSFORM IR SPECTROSCOPY; GASPHASE; IN-SITU; LIQUID PHASE; ORGANIC FUNCTIONALIZATION; PHOTOLUMINESCENCE MEASUREMENTS; REACTION PATHWAYS; SEMICONDUCTOR NANOCRYSTALS; SILICON NANOCRYSTALS; SURFACE FUNCTIONALIZATION; SURFACE LIGANDS; SURFACE PASSIVATION;

ACETYLENE; CHELATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; GASES; HYDROSILYLATION; LIGHTING; NANOCRYSTALS; OLEFINS; OPTOELECTRONIC DEVICES; PASSIVATION; SEMICONDUCTOR DEVICES; SILICON; STYRENE; SURFACE REACTIONS; SYNTHESIS (CHEMICAL);

SEMICONDUCTING SILICON;

ACETYLENE; ALKENE; NANOPARTICLE; SILICON;

ARTICLE; CHEMISTRY; GAS; INFRARED SPECTROSCOPY; OXIDATION REDUCTION REACTION; SEMICONDUCTOR; SURFACE PROPERTY;

ACETYLENE; ALKENES; GASES; NANOPARTICLES; OXIDATION-REDUCTION; SEMICONDUCTORS; SILICON; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES;

EID: 84855163579     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am200541p     Document Type: Article

References (47)

1. Reboredo, F. A.; Franceschetti, A.; Zunger, A. Phys. Rev. B 2000, 61, 13073
2. Mangolini, L.; Thimsen, E.; Kortshagen, U. Nano Lett. 2005, 5, 655
3. Jurbergs, D.; Rogojina, E.; Mangolini, L.; Kortshagen, U. Appl. Phys. Lett. 2006, 88
4. de Boer, W.; Timmerman, D.; Dohnalova, K.; Yassievich, I. N.; Zhang, H.; Buma, W. J.; Gregorkiewicz, T. Nat. Nanotechnol. 2010, 5, 878
5. Beard, M. C.; Knutsen, K. P.; Yu, P. R.; Luther, J. M.; Song, Q.; Metzger, W. K.; Ellingson, R. J.; Nozik, A. J. Nano Lett. 2007, 7, 2506
6. Murphy, C. J.; Coffer, J. L. Appl. Spectrosc. 2002, 56, 16A
7. Hirschman, K. D.; Tsybeskov, L.; Duttagupta, S. P.; Fauchet, P. M. Nature 1996, 384, 338
8. Pavesi, L.; Dal Negro, L.; Mazzoleni, C.; Franzo, G.; Priolo, F. Nature 2000, 408, 440
9. Li, Z. F.; Ruckenstein, E. Nano Lett. 2004, 4, 1463
10. Sailor, M. J.; Lee, E. J. Adv. Mater. 1997, 9, 783
11. Holec, T.; Chvojka, T.; Jelinek, I.; Jindrich, J.; Nemec, I.; Pelant, I.; Valenta, J.; Dian, J. Mater. Sci. Eng., C 2002, 19, 251
12. Timmerman, D.; Gregorkiewicz, T. Mater. Sci. Eng., B 2009, 159-60, 87
13. Svrcek, V.; Slaoui, A.; Muller, J. C. Thin Solid Films 2004, 451, 384
14. Liu, C. Y.; Holman, Z. C.; Kortshagen, U. R. Nano Lett. 2009, 9, 449
15. Puzder, A.; Williamson, A. J.; Grossman, J. C.; Galli, G. J. Am. Chem. Soc. 2003, 125, 2786
16. Anthony, R.; Kortshagen, U. Phys. Rev. B 2009, 80
17. Veinot, J. G. C. Chem. Commun. 2006, 4160
18. Buriak, J. M. Chem. Rev. 2002, 102, 1271
19. Seto, T.; Kawakami, Y.; Suzuki, N.; Hirasawa, M.; Aya, N. Nano Lett. 2001, 1, 315
20. Mangolini, L.; Jurbergs, D.; Rogojina, E.; Kortshagen, U. J. Lumin. 2006, 121, 327
21. Liao, Y. C.; Roberts, J. T. J. Am. Chem. Soc. 2006, 128, 9061
22. Mangolini, L.; Kortshagen, U. Adv. Mater. 2007, 19, 2513
23. Nozaki, T.; Nakamuta, T.; Sagawa, M.; Okazaki, K. J. Plasma Fusion Res. 2009, 8, 500
24. Hossain, M. Z.; Kato, H. S.; Kawai, M. J. Am. Chem. Soc. 2007, 129, 3328
25. Cicero, R. L.; Chidsey, C. E. D.; Lopinski, G. P.; Wayner, D. D. M.; Wolkow, R. A. Langmuir 2002, 18, 305
26. Lopinski, G. P.; Wayner, D. D. M.; Wolkow, R. A. Nature 2000, 406, 48
27. Tong, X.; DiLabio, G. A.; Wolkow, R. A. Nano Lett. 2004, 4, 979
28. Kosuri, M. R.; Gerung, H.; Li, Q. M.; Han, S. M.; Bunker, B. C.; Mayer, T. M. Langmuir 2003, 19, 9315
29. Kosuri, M. R.; Gerung, H.; Li, Q. M.; Han, S. M.; Herrera-Morales, P. E.; Weaver, J. F. Surf. Sci. 2005, 596, 21
30. Ng, A.; Ciampi, S.; James, M.; Harper, J. B.; Gooding, J. J. Langmuir 2009, 25, 13934
31. Takeuchi, N.; Kanai, Y.; Selloni, A. J. Am. Chem. Soc. 2004, 126, 15890
32. Cicero, R. L.; Linford, M. R.; Chidsey, C. E. D. Langmuir 2000, 16, 5688
33. Scheres, L.; Giesbers, M.; Zuilhof, E. Langmuir 2011, 26, 10924
34. Jariwala, B. N.; Ciobanu, C. V.; Agarwal, S. J. Appl. Phys. 2009, 106, 073305
35. Rai, V. R.; Agarwal, S. J. Phys. Chem. C 2009, 113, 12962
36. Jariwala, B. N.; Kramer, N. J.; Petcu, M. C.; van de Sanden, M. C. M.; Stradins, P.; Ciobanu, C. V.; Agarwal, S. J. Phys. Chem. C 2011, in press.
37. Pei, Y.; Ma, J. Langmuir 2006, 22, 3040
38. Takeuchi, N.; Kanai, Y.; Selloni, A. J. Phys. Chem. C 2010, 114, 3981
39. Choi, C. H.; Kertesz, M. J. Phys. Chem. A 1997, 101, 3823
40. Coates, J. In Encyclopedia of Analytical Chemistry; Meyers, R. A., Ed.; Wiley: New York, 2000; p 10815.
41. Mangolini, L.; Kortshagen, U. Phys. Rev. E 2009, 79, 026405
42. Martinez-Guerra, E.; Takeuchi, N. Phys. Rev. B 2007, 75
43. Chabal, Y. J. Physica B 1991, 170, 447
44. Miura, T.; Niwano, M.; Shoji, D.; Miyamoto, N. J. Appl. Phys. 1996, 79, 4373
45. Mawhinney, D. B.; Glass, J. A.; Yates, J. T. J. Phys. Chem. B 1997, 101, 1202
46. Pi, X. D.; Mangolini, L.; Campbell, S. A.; Kortshagen, U. Phys. Rev. B 2007, 75
47. Sieval, A. B.; Hout, B. v. d.; Zuilhof, H.; Sudhölter, E. J. R. Langmuir 2001, 17, 2172