Binary Pt-Si nanostructures prepared by focused electron-beam-induced deposition

ACS Nano

Volumn 5, Issue 12, 2011, Pages 9675-9681

  Winhold, Marcel ^a   Schwalb, Christian H ^a   Porrati, Fabrizio ^a   Sachser, Roland ^a   Frangakis, Achilleas S ^a   Kämpken, Britta ^a   Terfort, Andreas ^a   Auner, Norbert ^a   Huth, Michael ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

binary systems; electronic transport; focused electron beam induced deposition; nanogranular materials; nanostructures; platinum silicides

Indexed keywords

BINARY SYSTEMS; ELECTRONIC TRANSPORT; FOCUSED ELECTRON-BEAM-INDUCED DEPOSITION; NANOGRANULARS; PLATINUM SILICIDES;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; NANOSTRUCTURES; SILICIDES; SILICON; SYSTEMS (METALLURGICAL); TRANSMISSION ELECTRON MICROSCOPY;

PLATINUM;

NANOMATERIAL; PLATINUM; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRON; ELECTROPLATING INDUSTRY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; RADIATION EXPOSURE; SURFACE PROPERTY; ULTRASTRUCTURE;

ELECTRONS; ELECTROPLATING; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; PLATINUM; SILICON; SURFACE PROPERTIES;

EID: 84555220419     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn203134a     Document Type: Article

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