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Volumn 27, Issue 5, 2009, Pages 1204-1210

Modular ultrahigh vacuum-compatible gas-injection system with an adjustable gas flow for focused particle beam-induced deposition

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN PRINCIPLES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FOCAL AREA; GAS FLOWRATE; GAS FLOWS; GAS INJECTION SYSTEM; ORGANIC PRECURSOR; POWDERY SUBSTANCES; REPRODUCIBILITIES; SCANNING ELECTRON MICROSCOPE; VACUUM CHAMBERS;

EID: 70349116867     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3196789     Document Type: Article
Times cited : (6)

References (15)
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    • S. T. Davies and B. Khamsehpour, Vacuum 47, 455 (1996). 10.1016/0042-207X(95)00235-9 (Pubitemid 126362633)
    • (1996) Vacuum , vol.47 , Issue.5 , pp. 455-462
    • Davies, S.T.1    Khamsehpour, B.2
  • 5
    • 70349148057 scopus 로고    scopus 로고
    • Material Safety Data Sheet (MSDS), tungsten hexacarbonyl, CAS No. 14040-11-0.
    • Material Safety Data Sheet (MSDS), tungsten hexacarbonyl, CAS No. 14040-11-0.
  • 6
    • 0026122455 scopus 로고
    • E-beam induced X-ray mask repair with optimized gas nozzle geometry
    • DOI 10.1016/0167-9317(91)90093-S, Microcircuit Engineering '90
    • K. T. Kohlmann, M. Thiemann, and W. H. Brünger, Microelectron. Eng. 13, 279 (1991). 10.1016/0167-9317(91)90093-S (Pubitemid 21665459)
    • (1991) Microelectronic Engineering , vol.13 , Issue.1-4 , pp. 279-282
    • Kohlmann, K.T.1    Thiemann, M.2    Bruenger, W.H.3
  • 7
    • 0018467771 scopus 로고
    • SIMPLE CALIBRATED GAS FEED SYSTEM.
    • DOI 10.1063/1.1135866
    • C. M. Horwitz, Rev. Sci. Instrum. 50, 652 (1979). 10.1063/1.1135866 (Pubitemid 9458940)
    • (1979) Rev Sci Instrum , vol.50 , Issue.5 , pp. 652-654
    • Horwitz, C.M.1
  • 8
    • 33748268727 scopus 로고    scopus 로고
    • Measurement and simulation of impinging precursor molecule distribution in focused particle beam deposition/etch systems
    • DOI 10.1016/j.mee.2006.01.136, PII S0167931706001419
    • I. Utke, V. Friedli, S. Amorosi, J. Michler, and P. Hoffman, Microelectron. Eng. 83, 1499 (2006). 10.1016/j.mee.2006.01.136 (Pubitemid 44316479)
    • (2006) Microelectronic Engineering , vol.83 , Issue.4-9 SPEC. ISS. , pp. 1499-1502
    • Utke, I.1    Friedli, V.2    Amorosi, S.3    Michler, J.4    Hoffmann, P.5
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.