Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy

Nanoscale Research Letters

Volumn 6, Issue 1, 2011, Pages

  Giannazzo, Filippo ^a   Sonde, Sushant ^a,b   Rimini, Emanuele ^a,c   Raineri, Vito ^a  

^a CNR IMM   (Italy)

^b SCUOLA SUPERIORE DI CATANIA   (Italy)

^c UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITANCE MEASUREMENT; ELECTRONIC PROPERTIES; IONS; POINT DEFECTS; GRAPHENE; TRANSPORT PROPERTIES;

CHARGED IMPURITY; ELECTRON MEAN FREE PATH; ELECTRONIC TRANSPORT PROPERTIES; LATTICE VACANCY; LOCAL DENSITY; LOCAL VARIATIONS; SCANNING CAPACITANCE SPECTROSCOPY; SCANNING PROBES; ION FLUENCES; NANO SCALE;

GRAPHENE; IONS;

EID: 84255173393     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-109     Document Type: Article

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