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1
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0034259532
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High Breakdown GaN HEMT with over lapping Gate Structure
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Sep
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N.-Q. Zhang, S. Keller, G. Parish, S. Heikman, S. P. DenBaars, and U. K. Mishra, "High Breakdown GaN HEMT with Over lapping Gate Structure," IEEE Electron Device Lett., vol. 21, no. 9, pp. 421-423, Sep. 2000.
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(2000)
IEEE Electron Device Lett.
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, pp. 421-423
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Zhang, N.-.Q.1
Keller, S.2
Parish, G.3
Heikman, S.4
Denbaars, S.P.5
Mishra, U.K.6
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2
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34547924055
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Suppression of dynamic on-resistance increase and gate charge measurements in high-voltage GaN-HEMTs with optimized field-plate structure
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Aug
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W. Saito, T. Nitta, Y. Kakiuchi, Y. Saito, K. Tsuda, I. Omura, and M. Yamaguchi, "Suppression of Dynamic On-Resistance Increase and Gate Charge Measurements in High-Voltage GaN-HEMTs With Optimized Field-Plate Structure," IEEE Trans. Electron Devices, vol. 54, no. 8, pp. 1825-1830, Aug. 2007.
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(2007)
IEEE Trans. Electron Devices
, vol.54
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, pp. 1825-1830
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Saito, W.1
Nitta, T.2
Kakiuchi, Y.3
Saito, Y.4
Tsuda, K.5
Omura, I.6
Yamaguchi, M.7
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3
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75749126242
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Low on-resistance high-breakdown normally off AlN/GaN/AlGaN DHFET on si substrate
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Feb
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F. Medjdoub, J. Derluyn, K. Cheng, M. Leys, S. Degroote, D. Marcon, D. Visalli, M. Van Hove, M. Germain, and G. Borghs, "Low On-Resistance High-Breakdown Normally Off AlN/GaN/AlGaN DHFET on Si Substrate," IEEE Electron Device Lett., vol. 31 no. 2, pp. 111-113, Feb. 2010.
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(2010)
IEEE Electron Device Lett.
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, pp. 111-113
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Medjdoub, F.1
Derluyn, J.2
Cheng, K.3
Leys, M.4
Degroote, S.5
Marcon, D.6
Visalli, D.7
Van Hove, M.8
Germain, M.9
Borghs, G.10
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4
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77953683419
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GaN power transistors on si substrates for switching application
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Jul
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N. Ikeda, Y. Niiyama, H. Kambayashi, Y. Sato, T. Nomura, S. Kato, and S. Yoshida, "GaN Power Transistors on Si Substrates for Switching Application," in Proc. IEEE, vol. 98, no. 7, pp. 1151-1161, Jul. 2010.
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(2010)
Proc. IEEE
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, pp. 1151-1161
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Ikeda, N.1
Niiyama, Y.2
Kambayashi, H.3
Sato, Y.4
Nomura, T.5
Kato, S.6
Yoshida, S.7
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5
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33750906811
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Improvement of unipolar power device performance using a polarization junction
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Nov
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A. Nakajima, K. Adachi, M. Shimizu, and H. Okumura, "Improvement of unipolar power device performance using a polarization junction," Appl. Phys. Lett., vol. 89, no. 19, pp. 193501, Nov. 2006.
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Appl. Phys. Lett.
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, pp. 193501
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Nakajima, A.1
Adachi, K.2
Shimizu, M.3
Okumura, H.4
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6
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77950008037
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Enhancement-mode GaN Hybrid MOS-HEMTs with Breakdwon Voltage of 1300 v
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K. Tang, Z. Li, T. P. Chow, Y. Niiyama, T. Nomura, and S. Yoshida, "Enhancement-mode GaN Hybrid MOS-HEMTs with Breakdwon Voltage of 1300 V," in Proc. ISPSD, 2009, pp. 279-282
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(2009)
Proc. ISPSD
, pp. 279-282
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Tang, K.1
Li, Z.2
Chow, T.P.3
Niiyama, Y.4
Nomura, T.5
Yoshida, S.6
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7
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0031251517
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Theory of semiconductor superjunction devices
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Oct
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T. Fujihira, "Theory of Semiconductor Superjunction Devices," Jpn. J. Appl. Phys., vol. 36, pp. 6254-6262, Oct. 1997.
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(1997)
Jpn. J. Appl. Phys.
, vol.36
, pp. 6254-6262
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Fujihira, T.1
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8
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0031251517
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Theory of semiconductor superjunction devices
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Oct
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T. Fujihira, "Theory of Semiconductor Superjunction Devices," Jpn. J. Appl. Phys., vol. 36, pp. 6254-6262, Oct. 1997.
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(1997)
Jpn. J. Appl. Phys.
, vol.36
, pp. 6254-6262
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Fujihira, T.1
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9
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0032598956
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COOLMOSTM-A new milestone in high voltage power MOS
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L. Lorenz, G. Deboy, A. Knapp, and M. März, "COOLMOSTM-A new milestone in high voltage power MOS," in Proc. ISPSD, 1999, pp. 3-10.
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(1999)
Proc. ISPSD
, pp. 3-10
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Lorenz, L.1
Deboy, G.2
Knapp, A.3
März, M.4
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10
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78650853325
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High density two-dimensional hole gas induced by negative polarization at GaN/AlGaN Heterointerface
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Dec
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A. Nakajima, Y. Sumida, M. H. Dhyani, H. Kawai, and E. M. S. Narayanan, "High Density Two-dimensional Hole Gas Induced by Negative Polarization at GaN/AlGaN Heterointerface," Appl. Phys. Express, vol. 3, no. 12, p. 121004, Dec. 2010.
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(2010)
Appl. Phys. Express
, vol.3
, Issue.12
, pp. 121004
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Nakajima, A.1
Sumida, Y.2
Dhyani, M.H.3
Kawai, H.4
Narayanan, E.M.S.5
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11
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84880724484
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GaN based super heterojunction field effect transistors using the polarization junction concept
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A. Nakajima, Y. Sumida, M. H. Dhyani, H. Kawai, and E. M. S. Narayanan, "GaN Based Super Heterojunction Field Effect Transistors Using the Polarization Junction Concept," will be published in IEEE Electron Device Lett.
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Will Be Published in IEEE Electron Device Lett
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Nakajima, A.1
Sumida, Y.2
Dhyani, M.H.3
Kawai, H.4
Narayanan, E.M.S.5
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12
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0034140699
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The values of minority carrier diffusion lengths and lifetimes in GaN and their implications for bipolar devices
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Feb
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Z. Z. Bandi, P. M. Bridger, E. C. Piquette, and T. C. McGill, "The values of minority carrier diffusion lengths and lifetimes in GaN and their implications for bipolar devices," Solid-State Electron, vol. 44, pp. 221-228, Feb. 2006.
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(2006)
Solid-State Electron
, vol.44
, pp. 221-228
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Bandi, Z.Z.1
Bridger, P.M.2
Piquette, E.C.3
McGill, T.C.4
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13
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0141792945
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Mechanisms of current collapse and gate leakage currents in AlGaN/GaN heterostructure field effect transistors
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Jul./Aug
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H. Hasegawa, T. Inagaki, S. Ootomo, and T. Hashizume, "Mechanisms of current collapse and gate leakage currents in AlGaN/GaN heterostructure field effect transistors," J. Vac. Sci Technolo. B vol. 21, pp. 1844-1855, Jul./Aug. 2003.
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(2003)
J. Vac. Sci Technolo. B
, vol.21
, pp. 1844-1855
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Hasegawa, H.1
Inagaki, T.2
Ootomo, S.3
Hashizume, T.4
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14
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38149014747
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Gate injection transistor (GIT)-A normally-Off AlGaN/GaN power transistor using conductivity modulation
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Dec
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Y. Uemoto, M. Hikita, H. Ueno, H. Matsuo, H. Ishida, M. Yanagihara, T. Ueda, T. Tanaka, and D. Ueda, "Gate Injection Transistor (GIT)-A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation," IEEE Trans. Electron Devices, vol. 54, no. 12, pp. 3393-3399, Dec. 2007.
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(2007)
IEEE Trans. Electron Devices
, vol.54
, Issue.12
, pp. 3393-3399
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Uemoto, Y.1
Hikita, M.2
Ueno, H.3
Matsuo, H.4
Ishida, H.5
Yanagihara, M.6
Ueda, T.7
Tanaka, T.8
Ueda, D.9
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