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Volumn 84, Issue 31, 2004, Pages 3353-3373

Tensile strength of aluminium nitride films

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CHEMICAL VAPOR DEPOSITION; ELASTIC MODULI; FABRICATION; MICROELECTROMECHANICAL DEVICES; RESEARCH AND DEVELOPMENT MANAGEMENT; RESIDUAL STRESSES; ROBUSTNESS (CONTROL SYSTEMS); SEMICONDUCTING FILMS; STRAIN GAGES; TENSILE STRENGTH; TENSILE STRESS;

EID: 8344259821     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430412331283604     Document Type: Article
Times cited : (14)

References (25)
  • 1
    • 0003160015 scopus 로고
    • edited by S. M. Sze (Singapore: McGraw-Hill)
    • ADAM, A. C., 1985, VLSI Technology, edited by S. M. Sze (Singapore: McGraw-Hill), p. 121.
    • (1985) VLSI Technology , pp. 121
    • Adam, A.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.