Measuring the switching dynamics and energy efficiency of tantalum oxide memristors

Nanotechnology

Volumn 22, Issue 50, 2011, Pages

  Strachan, John Paul ^a   Torrezan, Antonio C ^a   Medeiros Ribeiro, Gilberto ^a   Williams, R Stanley ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; DYNAMICAL BEHAVIORS; ENERGY COST; METAL-OXIDE; REAL-TIME SWITCHING; RESISTANCE CHANGE; SWITCHING DYNAMICS;

COST BENEFIT ANALYSIS; DYNAMICS; MEMRISTORS; PASSIVE FILTERS; RESISTORS; SWITCHING; TANTALUM; TANTALUM OXIDES;

ENERGY EFFICIENCY;

EID: 82455167171     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/50/505402     Document Type: Article

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