Small-scale patterning methods for digital image correlation under scanning electron microscopy

Measurement Science and Technology

Volumn 22, Issue 12, 2011, Pages

  Kammers, A D ^a   Daly, S ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

deformation mechanisms; digital image correlation; electron beam lithography; microstructure; nanoparticles; SEM DIC; surface patterning

Indexed keywords

DEFORMATION; ELECTRON BEAM LITHOGRAPHY; ELECTRON MICROSCOPY; IMAGE ANALYSIS; LITHOGRAPHY; MICROSTRUCTURE; NANOPARTICLES; POLYCRYSTALLINE MATERIALS; STRAIN MEASUREMENT;

D. DIGITAL IMAGE CORRELATION (DIC); DEFORMATION MECHANISM; DIGITAL IMAGE CORRELATIONS; HIGH CONTRAST PATTERNS; MICRO-STRUCTURAL LENGTH; POLYCRYSTALLINE METALS; SURFACE DEFORMATION; SURFACE PATTERNING;

SCANNING ELECTRON MICROSCOPY;

EID: 81555207255     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/12/125501     Document Type: Article

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