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Volumn 339, Issue 1-2, 2003, Pages 265-280

A new tool for the experimental characterization of micro-plasticity

Author keywords

Digital image analysis; In situ deformation experiment; Local strain measurement; Micro plasticity; Polycrystalline copper

Indexed keywords

COPPER; GRAIN SIZE AND SHAPE; PLASTICITY; SCANNING ELECTRON MICROSCOPY; STRAIN;

EID: 0037413735     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00111-9     Document Type: Article
Times cited : (98)

References (44)
  • 39
    • 0000721416 scopus 로고    scopus 로고
    • A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, T. Huang, J. Serra (Eds.). IEEE Computer Society, Los Alamitos USA
    • P. Werth, S. Scherer, in: A. Sanfeliu, J.J. Villanueva, M. Vanrell, R. Alquezar, T. Huang, J. Serra (Eds.). Proceeding of 15th International Conference on Pattern Recognition, vol. 3, IEEE Computer Society, Los Alamitos USA, 2000, p. 738.
    • (2000) Proceeding of 15th International Conference on Pattern Recognition , vol.3 , pp. 738
    • Werth, P.1    Scherer, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.