Microstructure-Dependent local strain behavior in polycrystals through In-Situ scanning electron microscope tensile experiments

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 40, Issue 10, 2009, Pages 2363-2368

  Tschopp, Mark A ^a,b   Bartha, B B ^c   Porter, W J ^a,d   Murray, P T ^d   Fairchild, S B ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b UNIVERSAL TECHNOLOGY CORPORATION   (United States)

^c United Space Alliance LLC   (United States)

^d UNIVERSITY OF DAYTON RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; DAMAGE NUCLEATION; DIGITAL IMAGE CORRELATIONS; ELECTRON BACK SCATTER DIFFRACTION; EXTREME VALUE; HIGH TEMPERATURE; IN-SITU; IN-SITU EXPERIMENTS; LOCAL STRAINS; MAXIMUM SHEARS; MICROSTRUCTURE-PROPERTY RELATIONSHIPS; NICKEL- BASED SUPERALLOYS; PLATINUM NANOPARTICLES; POLYCRYSTALLINE; POLYCRYSTALLINE METALS; ROOM TEMPERATURE; SCHMID FACTORS; TRIPLE JUNCTION;

ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; EXPERIMENTS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NICKEL ALLOYS; PLATINUM; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

SHEAR STRAIN;

EID: 69949117620     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-009-9938-6     Document Type: Article

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