Standard Reference Material (SRM 1990) for Single Crystal Diffractometer Alignment

Journal of Research of the National Institute of Standards and Technology

Volumn 106, Issue 6, 2001, Pages 1071-1095

  Wong Ng, W ^a,i   Siegrist, T ^b,c,j   DeTitta, G T ^d   Finger, L W ^e   Evans Jr , H T ^f   Gabe, E J ^g,k   Enright, G D ^g   Armstrong, J T ^a,l   Levenson, M ^a,m   Cook, L P ^a   Hubbard, C R ^h  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b LUND UNIVERSITY   (Sweden)

^c LUCENT TECHNOLOGIES   (United States)

^d HAUPTMAN WOODWARD MEDICAL RESEARCH INSTITUTE   (United States)

^e GEOPHYSICAL LABORATORY   (United States)

^f U S GEOLOGICAL SURVEY   (United States)

^g NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^h OAK RIDGE NATIONAL LABORATORY   (United States)

ⁱ NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^j NOKIA RESEARCH CENTER   (United States)

^k Medical Foundation of Buffalo ^*

^l NIST Chemical Science and Technology Laboratory   (United States)

^m Federal Government

more..

Author keywords

Alignment standard; Cr content; International round robin; NIST SRM 1990; Ruby spheres; Single crystal x ray diffractometers

Indexed keywords

EID: 2242430819     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.106.058     Document Type: Article

References (40)

1. V. N. Voitsekhovskii, Evaporation Figures of Corundum, Kristallografiya 13, 563-565 (1968)
2. W C. Hamilton, Angle settings for four-circle diffractometers, International Tables for x-ray Crystallography 4, 275-284 (1974).
3. H. E. King and L. W. Finger, Diffracted Beam Crystal Centering and its Application to High- Pressure Crystallography, J. Appl. Crystallogr. 12, 374-378 (1979).
4. R M. Hazen and L. W. Finger, Comparative Crystal Chemistry, Temperature, Pressure, Composition and the variation of Crystal Chemistry, John Wiley & Sons, New York (1982) pp. 46-56.
5. W. R. Busing and H. A. Levy, Angle Calculations for 3- and 4-circle x-ray and neutron diffractometers, Acta Cryst. 22, 457-464 (1967).
6. A. Kuperman, S Nadimi, S. Oliver, G. A. Ozin, J. M. Garceees and M M. Olken, Non-aqueous synthesis of giant crystals of zeolite and molecular sieves. Nature 365, 239 (1993).
7. G. DeTitta, Ruby Spheres Round-Robin Project Instruction Maunal, Hauptman-Woodward Medical Research Institute, Buffalo, NY 14203.
8. L. M. Belyaev, Ruby and Sapphire, Nauka Publishers, Moscow (1974), translated from Russian, National Bureau of Standards, national Science Foundation, and Amerind Publishing Co. Pvt. Ltd , New Delhi, India, (1980) pp. 1-11.
9. W. C. Campbell and C Grain, Thermal Expansion of Alpha Alumina, U. S. Bur Mines Rep. Invest. 5757 (1961).
10. C. R. Hubbard and F. A. Mauer, Precision and Accuracy of the Bond Method as Applied to Small Spherical Crystals, J. Appl. Cryst. 9, 1-8 (1976).
11. W. J. Youden, Graphical Diagnosis of Interlaboratory test results, in National Bureau of Standards Special Publication 300 (1969).
12. Guide to NATA Proficiency Testing, National Association of Testing Authorities, Australia (1997).
13. J. Hartwig, G. Hölzer, E. Förster, K. Goetz, K. Wokulska, and J. Wolf, Remeasurement of characteristic x-ray emission lines and their application to line profile analysis and lattice parameter determination, Phys. Stat. Sol. (a) 143, 23-33 (1994).
14. 3- ions in sapphire, J. Am. Ceram. Soc. 79 (1), 3-11 (1996).
15. N. F Mott and M. J Littleton, Conduction in polar crystals, Trans Faraday Soc. 34, 485-499 (1938).
16. R. W. G. Wyckoff, Crystal Structure, Interscience Publishers, Inc. New York, Vol. II, Chap. V, 4.
17. DIFRAC, software suite for data collection and reduction of x-ray single crystal diffractometers, developed by E. Gabe et al. at the National Research Council (NRC) of Ottawa, Canada.
18. L. D. Calvert, E J. Gabe, and Y. Le Page, Ruby Spheres for Aligning Single-Crystal Diffractometers, IUCr Abstract 16 2-02 (M-14), Ottawa, Canada (1981).
19. W. R. Busing, and A. L. Henri, Angle Calculations for 3- and 4-circle x-ray and neutron diffractometers, Acta Cryst. 22, 457-464 (1967).
20. H. Toraya, The determination of unit-cell parameters from Bragg reflections data using a standard reference material but without a calibration curve, J. Appl Cryst. 26, 583-590 (1993).
21. E. R. Cohen and B. N. Taylor, The 1986 Adjustment of the fundamental Physical Constants, Rev. Mod Phys. 59, 1121-1148 (1987).
22. E. Jaroeswich, J. A. Nelen, and A. Noberg, Reference samples for electron microprobe analysis, Geostand. Newslett 4, 43-47.
23. J. T. Armstrong, quantitative elemental analysis of individual microparticle with electron beam instruments, in Electron Probe Quantification, K. F J. Heinrich and D. E. Newbury, eds., Plenum Press, New York (1991) pp. 261-315.
24. J. T Armstrong CITZAF: A Package of correction programs for the quantitative electron microbeam x-ray analysis of thick polished materials, thin films and particles, Microbeam Anal. 4, 177-200 (1995).
25. K. F. J. Heinrich, Electron Beam x-ray Microanalysis, Van Nostrand Reinhold Co., New York (1981) p. 578.
26. C. E. Fiori, C. R. Swyt, R. L. Myklebust, NIST/NIH Desktop Spectrum Analyzer Program and x-ray Database, NIST Standard Reference Database No. 36 (1991)
27. G. Hägg, and N. O. Ersson, (1960), An Easily Adjustable Guinier Camera of Highest precision, Acta Cryst. A25, Sppl, (1960) p. S64
28. C. R. Hubbard, C. Robbins and W. Wong-Ng, Standard Reference Material 640b (1987), Silicon Powder x-ray Diffraction Standard, obtainable from the NIST Office of Standard Reference Materials, Gaithersburg, MD 20899. Current price will be quoted on request.
29. G. Hägg, Measurement of x-ray Powder Diffraction Films with automatic Correction for Shrinkage, Rev. Sci. Instrum. 18, 371-377 (1947)
30. D. E. Appleman, and H. T. Evans, Jr., U. S. Dept of Commerce, Natl. Tech. Inform. Serv Publ. No. PB-216-188 (1973), National Technical Information Service, 5285 Port Royal Rd., Springfield, VA 22151.
31. H P. Klug, L. E. and Alexander, X-ray Diffraction Procedures. For Polycrystalline and Amorphous Materials, John Wiley & Sons, Inc, New York (1972).
32. R. G. Munro, Evaluated Material Properties for a Sintered α-alumina, J. Am. Ceram. Soc. 80 (8) 1919-28 (1997).
33. 3 at 2170 K, Acta Cryst B36, 228-230 (1980).
34. M. C. Morris, H. F. McMurdie, E. H. Evans, B. Paretzkin, H. S. Parker, and N. C. Panbgiotpoulos, Standard x-ray Diffraction Powder Patterns, Natl. Bur. Standards Monograph 25, Sect 18 (1981) p. 61.
35. 3 structures, Z. Kristallogr. 117 (8) 235-237 (1962).
36. R. D. Shannon, Revised Effective Ionic Radii and Systematic Studies of Interatomic Distances in Halides and Chalcogenides, Acta. Cryst. A32, 751-767 (1976).
37. The American National Standard for Expressing Uncertainty - U.S. Guide to the Expression of Uncertainty of Measurement (ANSI/NCSL Z540-2-1997).
38. R. Jenkins, and R. S. Snyder, Introduction to x-ray Powder Diffractometry, John-Wiley & Sons, Inc. (1996) p. 177.
39. R. L. Ralph, and L. W. Finger, A computer program for refinement of crystal orientation matrix and lattice constants from diffractometer data with lattice symmetry constraints. J. Appl. Cryst. 15, 537-539 (1982)
40. L. K. Frevel, T. J. Emge, and T. J. Kistenmacher, An Error Assessment of Single-Crystal 26 Data from Four-Circle Diffractometer, J. Appl. Cryst. 16, 126-132 (1983).