X-ray microbeam measurements of subgrain stress distributions in polycrystalline materials

Materials Science and Engineering: A

Volumn 399, Issue 1-2, 2005, Pages 43-48

  Ice, G E ^a   Larson, B C ^a   Tischler, J Z ^a   Liu, W ^a   Yang, W ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Polycrystalline materials; Strain tensor; X ray microbeam

Indexed keywords

BRITTLENESS; GRAIN SIZE AND SHAPE; STRAIN; STRESS CONCENTRATION; SYNCHROTRON RADIATION; X RAY OPTICS;

DUCTILE MATERIALS; SPATIAL RESOLUTION; X-RAY CRYSTAL MICROSCOPE; X-RAY MICROBEAM MEASUREMENT;

POLYCRYSTALLINE MATERIALS;

STRESS DISTRIBUTION;

EID: 23344447776     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2005.02.035     Document Type: Article

References (22)

1. F.J. Humphreys M. Hatherly Recrystallization and Related Annealing Phenomena 1995 Elsevier Science Inc.
2. E.C. Oliver et al. Ecrs 6: Proceedings of the 6th European Conference on Residual Stresses 2002 489-494
3. J.W.L. Pang T.M. Holden T.E. Mason Acta Mater. 46 5 1998 1503-1518
4. T.M. Holden R.A. Holt J.W.L. Pang Metall. Mater. Trans. A 33 3 2002 749-755
5. T.M. Holden C.N. Tome R.A. Holt Metall. Mater. Trans. A 29 12 1998 2967-2973
6. J.-S. Chung G.E. Ice J. Appl. Phys. 86 1999 5249-5256
7. B.C. Larson Wenge Yang G.E. Ice J.D. Budai J.Z. Tischler Nature 415 2002 887-890
8. G.E. Ice B.C. Larson Adv. Eng. Mater. 2 2000 643-646
9. G.E. Ice J.S. Chung J.Z. Tischler A. Lunt L. Assoufid Rev. Sci. Inst. 71 2000 2635-2639
10. G.E. Ice J.S. Chung W. Lowe E. Williams J. Edelman Rev. Sci. Inst. 71 2000 2001-2006
11. H.F. Poulsen S.F. Nielsen E.M. Lauridsen S. Schmidt R.M. Suter U. Lienert L. Margulies T. Lorentzen D. Juul Jensen J. Appl. Cryst. 34 2001 751-756
12. U. Lienert R. Martins S. Grigull M. Pinkerton H.F. Poulson A. Kvick Mater. Res. Soc. 590 2000 241
13. C.R. Patterson II K.I. Ignatiev A. Guvenilir J.S. Haase R. Morano Z.U. Rek S.R. Stock Mater. Res. Soc. 590 2000 253
14. B.C. Larson N. Tamura J.S. Chung G.E. Ice J.D. Budai J.Z. Tischler W. Yang H. Weiland W.P. Lowe Mater. Res. Soc. Symp. 590 2000 247
15. I.A. Sheremetyev A.V. Turbal Y.M. Litvinov M.A. Mikhailov Nucl. Inst. Meth. A308 1991 451-455
16. R.B.G. Ravelli A.M.F. Hezemans H. Krabbendam J. Kroon J. Appl. Cryst. 29 1996 270-278
17. H.R. Wenk F. Heidelbach D. Chateigner F. Zontone J. Synch. Rad. 4 1997 95-101
18. W.R. Busing H.A. Levy Acta Cryst. 22 1967 457-464
19. A.L. Patterson International Tables for X-ray Crystallography vol. II 1959 Kynoch Press Birmingham p. 61
20. J.S. Rollett Computing Methods in Crystallography 1965 Pergamon Press Oxford pp. 22-23, 28-31
21. I.C. Noyan J.B. Cohen Residual Stress: Measurement by Diffraction and Interpellation 1987 Springer-Verlag New York
22. W.J. Choi T.Y. Lee K.N. Tu N. Tamura R.S. Celestre A.A. MacDowell Y.Y. Bong L.G.T.T. Sheng IEEE 52nd Electronic Component & Technology Conference Proceedings IEEE Catalog number 02CH3734-5, San Diego, CA, 28-31 May 2002 628-633 LBNL-51035