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Volumn 110, Issue 9, 2011, Pages

Improved reliability of magnetic field programmable gate arrays through the use of memristive tunnel junctions

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL NEURAL NETWORKS; ERROR TOLERANCE; FIELD PROGRAMMABLE LOGIC; IMPROVED RELIABILITY; MAGNETIC RANDOM ACCESS MEMORIES; MAGNETIC TUNNEL JUNCTION; MEMRISTOR; NEW APPLICATIONS;

EID: 81355142760     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3660521     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.