Reliability of field programmable magnetic logic gate arrays

Applied Physics Letters

Volumn 88, Issue 4, 2006, Pages 1-3

  Reiss, G ^a   Meyners, D ^a  

^a BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; LOGIC CIRCUITS; LOGIC GATES; MAGNESIUM COMPOUNDS; MAGNETORESISTANCE; RELIABILITY; THIN FILMS;

MAGNETIC LOGIC CIRCUITS; RADIATION HARDNESS;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 31544432880     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2167609     Document Type: Article

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