Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests

Microelectronics Reliability

Volumn 50, Issue 9-11, 2010, Pages 1559-1562

  Vazquez M ^a,b   Nunez N ^a,b   Nogueira, E ^a   Borreguero, A ^a  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

^b INSTITUTO DE ENERGÍA SOLAR   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DIGITAL STORAGE; DURABILITY; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LIGHT EMITTING DIODES; TESTING;

ACCELERATED LIFE TESTS; ACCELERATED TESTS; CATASTROPHIC FAILURES; DEGRADATION RATE; DEGRADATION TREND; DRIVE CURRENTS; HIGH DURABILITY; LOW CONSUMPTION;

ALUMINUM COMPOUNDS;

EID: 81355129862     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.07.057     Document Type: Conference Paper

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