Measurement of temperature profiles on visible light-emitting diodes by use of a nematic liquid crystal and an infrared laser

Optics Letters

Volumn 29, Issue 22, 2004, Pages 2656-2658

  Park, Jeong ^a   Shin, Moowhan ^b   Lee, Chin C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Myong Ji University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PATH; TEMPERATURE PROFILES; TEMPERATURE-SENSING ELEMENTS;

INFRARED DEVICES; MICROPROCESSOR CHIPS; NEMATIC LIQUID CRYSTALS; OPTICAL MICROSCOPY; SEMICONDUCTOR JUNCTIONS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

LIGHT EMITTING DIODES;

EID: 9144253970     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.002656     Document Type: Article

References (7)

1. M. Arik, J. Petroski, and S. Weaver, in The Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 2002), pp. 113-120.
2. M. Osinski, J. Zeller, P.-C. Chiu, and B. S. Phillips, Appl. Phys. Lett. 69, 898 (1996).
3. C. Huh, W. J. Schaff, L. F. Eastman, and S. J. Park, IEEE Electron Device Lett. 25, 424 (2004).
4. S. Yamakoshi, T. Sanada, O. Wada, I. Umebu, and T. Sakurai, Appl. Phys. Lett. 40, 144 (1982).
5. P. Fischer, J. Christen, M. Zacharias, V. Schwegler, C. Kirchner, and M. Kamp, Appl. Phys. Lett. 75, 3440 (1999).
6. M. Nishiguchi, M. Fujihara, A. Miki, and H. Nishizawa, IEEE Trans. Component Hybrids Manuf. Technol. 16, 543 (1993).
7. J. Park, M. Shin, and C. C. Lee, IEEE Electron Device Lett. 24, 424 (2003).