Influence of a carbon over-coat on the X-ray reflectance of XEUS mirrors

Optics Communications

Volumn 279, Issue 1, 2007, Pages 101-105

  Lumb, D H ^a   Christensen, F E ^b   Jensen, C P ^b   Krumrey, M ^c  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL TELESCOPES; OPTIMIZATION; PHOTONS; SILICON WAFERS; X RAY SPECTROMETERS;

GRAZING INCIDENCE ANGLE; SILICON SAMPLES; X-RAY EVOLVING UNIVERSE SPECTROMETER (XEUS) MISSION; X-RAY REFLECTANCE;

MIRRORS;

EID: 34548606526     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.06.049     Document Type: Article

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