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Volumn 26, Issue 11, 2011, Pages

UV and visible Raman scattering of ultraheavily Ti implanted Si layers for intermediate band formation

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING PROCESS; CRYSTAL QUALITIES; CRYSTALLINE LAYERS; CRYSTALLINITIES; DEGREE OF CRYSTALLINITY; HIGH DOSE; HOST LATTICE; IMPLANTED LAYERS; IMPLANTED REGION; INTERMEDIATE BANDS; NANOSECOND PULSED LASER; ORDERS OF MAGNITUDE; RAMAN SCATTERING MEASUREMENTS; SI LAYER; SOLID SOLUBILITIES; THEORETICAL PREDICTION; UV- AND; UV-RAMAN; VISIBLE RAMAN SPECTRA;

EID: 80054903672     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/26/11/115003     Document Type: Article
Times cited : (16)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.