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Volumn 26, Issue 11, 2011, Pages
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UV and visible Raman scattering of ultraheavily Ti implanted Si layers for intermediate band formation
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING PROCESS;
CRYSTAL QUALITIES;
CRYSTALLINE LAYERS;
CRYSTALLINITIES;
DEGREE OF CRYSTALLINITY;
HIGH DOSE;
HOST LATTICE;
IMPLANTED LAYERS;
IMPLANTED REGION;
INTERMEDIATE BANDS;
NANOSECOND PULSED LASER;
ORDERS OF MAGNITUDE;
RAMAN SCATTERING MEASUREMENTS;
SI LAYER;
SOLID SOLUBILITIES;
THEORETICAL PREDICTION;
UV- AND;
UV-RAMAN;
VISIBLE RAMAN SPECTRA;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
ULTRAFAST LASERS;
SILICON;
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EID: 80054903672
PISSN: 02681242
EISSN: 13616641
Source Type: Journal
DOI: 10.1088/0268-1242/26/11/115003 Document Type: Article |
Times cited : (16)
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References (25)
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