The three-dimensional point spread function of aberration-corrected scanning transmission electron microscopy

Microscopy and Microanalysis

Volumn 17, Issue 5, 2011, Pages 817-826

  Lupini, Andrew R ^a   De Jonge, Niels ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

3D; aberration correction; nanoparticles; residual aberrations; STEM

Indexed keywords

ARTICLE; METHODOLOGY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING;

IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 80054891262     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611011913     Document Type: Article

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