High-resolution imaging of molecular and nanoparticles assemblies with kelvin force microscopy

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 11, 2010, Pages 7060-7064

  Magonov, Sergei ^a   Alexander, John ^a   Jeong, Soo Hwan ^b   Kotov, Nicholas ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

CdTe; Fluoroalkanes; Kelvin force microscopy; Self assembly; Surface potential

Indexed keywords

BOTTOM LAYERS; CDTE; CDTE NANOPARTICLES; FLUOROALKANES; HIGH RESOLUTION; HIGH-RESOLUTION IMAGING; KELVIN FORCE MICROSCOPY; MOLECULAR CHAINS; MOLECULAR DIPOLE; MOLECULAR LAYER; SELF ORGANIZED STRUCTURES; SEMIFLUORINATED ALKANES; STRUCTURAL TRANSITIONS; VERTICAL DIRECTION;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; MICA; MOLECULAR ORIENTATION; NANOPARTICLES; NANOWIRES; PARAFFINS; PHASE TRANSITIONS; SELF ASSEMBLY; SILICATE MINERALS; SUBLIMATION; SURFACE POTENTIAL; VISUALIZATION;

SURFACE PROPERTIES;

EID: 79955543924     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.2876     Document Type: Conference Paper

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