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Volumn , Issue , 2010, Pages 974-978

Ovenized and thermally tunable aluminum nitride microresonators

Author keywords

aluminum nitride resonator; frequency tuning; oven based tuning; ovenization; thermal model

Indexed keywords

ALN; ALN FILMS; BULK MATERIALS; CROSS SECTIONAL AREA; FREQUENCY SHIFT; FREQUENCY-TUNING; HIGH THERMAL; IN-VACUUM; LOCALIZED HEATING; LOW POWER; MICRO RESONATORS; OVEN-BASED TUNING; OVENIZATION; POLYCRYSTALLINE ALUMINUM; POWER EFFICIENT; TEMPERATURE INCREASE; THERMAL MODEL;

EID: 80054753575     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULTSYM.2010.5935635     Document Type: Conference Paper
Times cited : (28)

References (13)
  • 5
    • 34147142470 scopus 로고    scopus 로고
    • Single-chip multiple- frequency AlN MEMS filters based on contour-mode piezoelectric resonators
    • G. Piazza, P. J. Stephanou, and A. P. Pisano, "Single-Chip Multiple- Frequency AlN MEMS Filters Based on Contour-Mode Piezoelectric Resonators," Journal of MicroElectroMechanical Systems, vol. 16, pp. 319-328, 2007.
    • (2007) Journal of MicroElectroMechanical Systems , vol.16 , pp. 319-328
    • Piazza, G.1    Stephanou, P.J.2    Pisano, A.P.3
  • 6
    • 77952828356 scopus 로고    scopus 로고
    • Super high frequency width extensional aluminum nitride MEMS resonators
    • Rome, Italy
    • K. E. Wojciechowski, R. H. Olsson, and M. R. Tuck, "Super high frequency width extensional aluminum nitride MEMS resonators," in IEEE Ultrasonics Symposium, Rome, Italy, 2009, pp. 1179-1182.
    • (2009) IEEE Ultrasonics Symposium , pp. 1179-1182
    • Wojciechowski, K.E.1    Olsson, R.H.2    Tuck, M.R.3
  • 11
    • 0011965246 scopus 로고    scopus 로고
    • Thermal conductivity measurement of submicron-thick films deposited on substrates by modified ac calorimetry (laser-heating ångstrom method)
    • R. Kato, A. Maesono, and R. P. Tye, "Thermal Conductivity Measurement of Submicron-Thick Films Deposited on Substrates by Modified ac Calorimetry (Laser-Heating Ångstrom Method)," International Journal of Thermophysics, vol. 22, pp. 617-629, 2001.
    • (2001) International Journal of Thermophysics , vol.22 , pp. 617-629
    • Kato, R.1    Maesono, A.2    Tye, R.P.3
  • 12
    • 7544231369 scopus 로고    scopus 로고
    • Pulsed photothermal reflectance measurement of the thermal conductivity of sputtered aluminum nitride thin films
    • Y. Zhao, C. Zhu, S. Wang, J. Z. Tian, D. J. Yang, C. K. Chen, H. Cheng, and P. Hing, "Pulsed photothermal reflectance measurement of the thermal conductivity of sputtered aluminum nitride thin films," Journal of applied physics, vol. 96, pp. 4563-4568, 2004.
    • (2004) Journal of Applied Physics , vol.96 , pp. 4563-4568
    • Zhao, Y.1    Zhu, C.2    Wang, S.3    Tian, J.Z.4    Yang, D.J.5    Chen, C.K.6    Cheng, H.7    Hing, P.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.