Image deformation in field ion microscopy of faceted crystals

Ultramicroscopy

Volumn 110, Issue 3, 2010, Pages 234-241

  NiewieczerzaŁ, Daniel ^a   Oleksy, CzesŁaw ^a   Szczepkowicz, Andrzej ^a  

^a UNIVERSITY OF WROC AW   (Poland)

Author keywords

Faceted surfaces; Field ion microscopy; Image deformation

Indexed keywords

EXPERIMENTAL OBSERVATION; FACETED CRYSTALS; FACETED SURFACES; FIELD ION MICROSCOPY; IMAGE DEFORMATION; IN-FIELD; ION IMAGES; NUMERICAL SIMULATION; ORDER OF MAGNITUDE; SMOOTH SURFACE;

COMPUTER SIMULATION; CRYSTALS; DEFORMATION; ION MICROSCOPES; SURFACE TOPOGRAPHY;

IONS;

ANISOTROPY; ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; ELECTRIC FIELD; ELECTRON MICROSCOPY; FIELD ION MICROSCOPY; FINITE ELEMENT ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; SIMULATION; SURFACE PROPERTY;

EID: 75849130638     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.12.001     Document Type: Article

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