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Volumn 24, Issue 6, 2008, Pages 682-688

Cross-correlative TEM and atom probe analysis of partial crystallisation in NiNbSn metallic glasses

Author keywords

Atom probe; Metallic glass; Ni alloys; Reconstruction; Recrystallisation; TEM

Indexed keywords

ALLOYS; METALLIC GLASS; NICKEL;

EID: 47549096826     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328408X293595     Document Type: Article
Times cited : (28)

References (13)
  • 8
    • 0003800798 scopus 로고    scopus 로고
    • New York, Kluwer Academic/Plenum. Publishing
    • M. K. Miller: 'Atom probe tomography'; 2000, New York, Kluwer Academic/Plenum. Publishing.
    • (2000) Atom probe tomography
    • Miller, M.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.