Correlation between tem imaging and microanalysis for atom probe reconstruction verification

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 250-251

  Thompson, G B ^a   Genc, A ^b   Morris, R ^a   Torres, K L ^a   Fraser, H L ^b  

^a UNIVERSITY OF ALABAMA   (United States)

^b The Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949116388     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609099310     Document Type: Article

References (6)

1. F. Vurpillot, A. Bostel and D. Blavette Journal of Microscopy 196(3) (1999) 332-336.
2. F. Vurpillot, D. Larson, and A. Cerezo 36 (2004) 552-558.
3. G.B. Thompson, R. Banerjee, S.A. Dregia, and H.L. Fraser Journal of Materials Research 19(3) (2004) 707-715.
4. J. J. Hren, J.I. Goldstein, D.C. Joy Introduction to Analytical Electron Microscopy, Pleunum Press, New York and London (1979) 275.
5. K. Thompson, D. Lawrence, DJ Larson, JD Olson, TF Kelly and B. Gorman Ultramicroscopy 107 (2007) 131-139
6. S. Corcoran is thanked for supplying the tri-gate device structure for the study.