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Volumn 520, Issue 1, 2011, Pages 314-319

Growth and crystallization of molybdenum layers on amorphous silicon

Author keywords

Cluster; Crystallization; Interfaces; Transmission electron microscopy

Indexed keywords

AMORPHOUS SILICON (A-SI); CLUSTER; DIRECT CURRENT MAGNETRON SPUTTERING; LAYER THICKNESS; METAL LAYER; NOMINAL THICKNESS; TRANSIENT STATE;

EID: 80054023208     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.06.056     Document Type: Article
Times cited : (14)

References (35)
  • 7
    • 27144434424 scopus 로고    scopus 로고
    • L.J. Chen JOM 57 9 2005 24
    • (2005) JOM , vol.57 , Issue.9 , pp. 24
    • Chen, L.J.1
  • 34
    • 0001984531 scopus 로고
    • North-Holland Publishing Amsterdam-Oxford-New-York-Tokyo
    • R.W. Cahn, and P. Haasen Physical Metallurgy, V2 1983 North-Holland Publishing Amsterdam-Oxford-New-York-Tokyo
    • (1983) Physical Metallurgy, V2
    • Cahn, R.W.1    Haasen, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.