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Volumn 520, Issue 1, 2011, Pages 351-355

Conformational morphology of polyaniline grown on self-assembled monolayer modified silicon

Author keywords

Atomic force microscopy; High resolution transmission electron microscopy; Polyaniline; Power spectral density; Self assembly

Indexed keywords

BIPHASIC; EMERALDINE BASE; EMERALDINE SALT; HIGH RESOLUTION; ORDER PARAMETER; ORDERED LATTICE; POLYANILINE FILM; POWER SPECTRAL DENSITY ANALYSIS; SELF-ORGANIZATIONS; SI SUBSTRATES; SINGLE-CRYSTALLINE; STRUCTURAL ORDERS;

EID: 80054020818     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.07.006     Document Type: Article
Times cited : (4)

References (35)
  • 32
    • 0003869875 scopus 로고    scopus 로고
    • Software Version 5.12rb, Digital Instruments/Veeco Metrology Group, Inc.
    • Nanoscope command reference manual, Software Version 5.12rb, Digital Instruments/Veeco Metrology Group, Inc. 2001.
    • (2001) Nanoscope Command Reference Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.