Atomic force microscopy and kelvin probe force microscopy evidence of local structural inhomogeneity and nonuniform dopant distribution in conducting polybithiophene

Journal of Physical Chemistry

Volumn 100, Issue 48, 1996, Pages 18605-18606

  Semenikhin, Oleg A ^a   Jiang, Lei ^a   Iyoda, Tomokazu ^b   Hashimoto, Kazuhito ^b   Fujishima, Akira ^c  

^a KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

^b FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751025267     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp960844y     Document Type: Article

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