Morphology and structure of highly crystalline polyaniline films

Synthetic Metals

Volumn 159, Issue 11, 2009, Pages 1067-1071

  Sutar, D S ^a   Tewari, R ^b   Dey, G K ^b   Gupta, S K ^b   Yakhmi, J V ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

AFM; Electron diffraction; Polyaniline; Self assembly; Single crystal; TEM

Indexed keywords

AFM; BRIGHTFIELD; CONDUCTIVE AFM; CRYSTALLINE DOMAINS; DARK FIELD IMAGING; FILM MORPHOLOGY; NANOCRYSTALLITE SIZE DISTRIBUTION; ORTHORHOMBIC STRUCTURES; POLYANILINE FILM; POLYCRYSTALLINE; RECTANGULAR SYMMETRY; SELECTED AREA ELECTRON DIFFRACTION; SELF-ORGANIZATION; SILICON SUBSTRATES; TEM; UNIT CELL PARAMETERS;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; CONDUCTIVE PLASTICS; CRYSTAL SYMMETRY; CRYSTALLINE MATERIALS; DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRONS; HOLOGRAPHIC INTERFEROMETRY; MONOLAYERS; MORPHOLOGY; POLYANILINE; SELF ASSEMBLY; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE CRYSTALS;

EID: 67349224056     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2009.01.030     Document Type: Article

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