Surface morphology characterization of pentacene thin film and its substrate with under-layers by power spectral density using fast Fourier transform algorithms

Applied Surface Science

Volumn 253, Issue 14, 2007, Pages 6196-6202

  Itoh, Taketsugu ^a   Yamauchi, Noriyoshi ^b  

^a Worldwide Product Engineering   (Japan)

^b WASEDA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Fast Fourier transform; Pentacene; Power spectral density

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; FAST FOURIER TRANSFORMS; FILM GROWTH; POWER SPECTRAL DENSITY; SURFACE MORPHOLOGY; THIN FILM TRANSISTORS;

LINEAR CONTINUUM MODEL (LCM); PEAK-TO-VALLEY VALUE; PENTACENE; ROOT-MEAN-SQUARE (RMS);

THIN FILMS;

EID: 34247155748     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.01.056     Document Type: Article

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