Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies

Surface and Interface Analysis

Volumn 43, Issue 11, 2011, Pages 1365-1370

  Gergely, G ^a   Gurban, S ^a   Menyhard, M ^a   Jablonski, A ^b   Zemek, J ^c   Goto, K ^d  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c INSTITUTE OF PHYSICS   (Czech Republic)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

AES; AREPES; backscattering probability; EPES; SEP; XPS

Indexed keywords

AES; AREPES; BACK-SCATTERED; ELASTIC BACKSCATTERING; ELASTIC PEAK; ELECTRON SPECTRUM; EPES; EXPERIMENTAL DETERMINATION; EXPERIMENTAL VALUES; PRIMARY ENERGIES; SEP; SOLID ANGLE; SURFACE EXCITATION PARAMETERS; SURFACE LOSS; TRIAL-AND-ERROR METHOD;

BACKSCATTERING; C (PROGRAMMING LANGUAGE); DATABASE SYSTEMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS;

PROBABILITY;

EID: 80053966852     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3723     Document Type: Article

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