The inelastic mean free path of electrons. Past and present research

Vacuum

Volumn 84, Issue 1, 2009, Pages 134-136

  Gergely, G ^a   Gurban, S ^a   Menyhard, M ^a   Jablonski, A ^b   Zommer, L ^b   Goto, K ^c  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Elastic peak electron spectroscopy; Inelastic mean free path; Quantification based on Goto's data; Surface excitation correction

Indexed keywords

CYLINDRICAL MIRROR; DETECTION ANGLE; ELASTIC PEAK; ELASTIC PEAK ELECTRON SPECTROSCOPY; EXPERIMENTAL DATA; EXPERIMENTAL DETERMINATION; INELASTIC MEAN FREE PATH; MATERIAL PARAMETER; PAST AND PRESENT; QUANTIFICATION BASED ON GOTO'S DATA; SOLID ANGLE; SURFACE EXCITATION CORRECTION; SURFACE EXCITATIONS; SURFACE LOSS;

ELECTRON SPECTROSCOPY; ELECTRONS; NICKEL; SILICON;

SURFACES;

EID: 69249217684     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.06.009     Document Type: Article

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