Information depth for elastic-peak electron spectroscopy

Surface Science

Volumn 551, Issue 1-2, 2004, Pages 106-124

  Jablonski, A ^a   Powell, C J ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Computer simulations; Copper; Electron solid interactions; Electron solid scattering and transmission elastic; Gold; Monte Carlo simulations

Indexed keywords

AMORPHOUS MATERIALS; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; COMPUTER SIMULATION; COPPER; GOLD; MATHEMATICAL MODELS; MONTE CARLO METHODS; POLYCRYSTALLINE MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC-PEAK ELECTRON SCATTERING (EPES); ELECTRON-SOLID INTERACTIONS;

SURFACE PHENOMENA;

EID: 0842329810     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.036     Document Type: Article

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