Electrical conduction processes in ZnO in a wide temperature range 20-500 K

Journal of Applied Physics

Volumn 110, Issue 6, 2011, Pages

  Lien, Chien Chi ^a   Wu, Chih Yuan ^b   Li, Zhi Qing ^c   Lin, Juhn Jong ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b FU JEN CATHOLIC UNIVERSITY   (Taiwan)

^c TIANJIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN; CONDUCTION MECHANISM; CONDUCTION PROCESS; DEEP DONOR; ELECTRICAL CONDUCTION; ELECTRICAL CONDUCTION MECHANISMS; IMPURITY BANDS; IN-VACUUM; POLYCRYSTALLINE FILM; SHALLOW DONORS; TEMPERATURE INCREASE; TEMPERATURE RANGE; THERMAL ACTIVATION; VARIABLE-RANGE-HOPPING CONDUCTIONS; ZNO; ZNO SINGLE CRYSTALS;

ACTIVATION ENERGY; CRYSTAL IMPURITIES; HELIUM; OXYGEN VACANCIES; SINGLE CRYSTALS;

ZINC OXIDE;

EID: 80053543367     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3638120     Document Type: Article

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