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Volumn 50, Issue 9 PART 1, 2011, Pages

Carrier transport in volatile memory device with SnO2 quantum dots embedded in a polyimide layer

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE; CARRIER TRANSPORT CHARACTERISTICS; CURRENT VOLTAGE CURVE; ELECTRIC STATE; HOLES TRAPPING; HYBRID MEMORIES; MATRIX; MEMORY DEVICE; POLYIMIDE LAYERS; SELF-ASSEMBLED; SHALLOW TRAPS; VOLATILE MEMORY;

EID: 80053011588     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.095003     Document Type: Article
Times cited : (14)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.