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Volumn 123, Issue 20, 2005, Pages

Simulating the thermal behavior and fragmentation mechanisms of exohedral and substitutional silicon-doped C 60

Author keywords

[No Author keywords available]

Indexed keywords

HEATING RATE; INTERATOMIC INTERACTIONS; MOLECULAR-DYNAMIC INTERACTIONS; THERMAL BEHAVIOR;

EID: 28344457987     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2130707     Document Type: Article
Times cited : (35)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.