-
1
-
-
84857754939
-
-
(Eds.)
-
Coufal, H., Dhar, L., and Mee, C. D. (Eds.) MRS Bull. 2006, 67.
-
(2006)
MRS Bull.
, vol.67
-
-
Coufal, H.1
Dhar, L.2
Mee, C.D.3
-
3
-
-
56349106474
-
-
Lee, Y., Choi, J.-r., Lee, K. J., Stott, N. E., and Kim, D. Nanotechnology 2008, 19, 415604
-
(2008)
Nanotechnology
, vol.19
, pp. 415604
-
-
Lee, Y.1
Choi, J.-R.2
Lee, K.J.3
Stott, N.E.4
Kim, D.5
-
4
-
-
0001438092
-
-
Schulz, D. L., Pehnt, M., Rose, D. H., Urgiles, E., Cahill, A. F., Niles, D. W., Jones, K. M., Ellingson, R. J., Curtis, C. J., and Ginley, D. S. Chem. Mater. 1997, 9, 889-900
-
(1997)
Chem. Mater.
, vol.9
, pp. 889-900
-
-
Schulz, D.L.1
Pehnt, M.2
Rose, D.H.3
Urgiles, E.4
Cahill, A.F.5
Niles, D.W.6
Jones, K.M.7
Ellingson, R.J.8
Curtis, C.J.9
Ginley, D.S.10
-
5
-
-
0037460138
-
-
Guo, Q., Teng, X., Rahman, S., and Yang, H. J. Am. Chem. Soc. 2003, 125, 630-631
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 630-631
-
-
Guo, Q.1
Teng, X.2
Rahman, S.3
Yang, H.4
-
7
-
-
4544323425
-
-
Guo, Q., Teng, X., and Yang, H. Adv. Mater. 2004, 16, 1337-1341
-
(2004)
Adv. Mater.
, vol.16
, pp. 1337-1341
-
-
Guo, Q.1
Teng, X.2
Yang, H.3
-
8
-
-
22944489533
-
-
Park, J.-I., Lee, W.-R., Bae, S.-S., Kim, Y. J., Yoo, K.-H., Cheon, J., and Kim, S. J. Phys. Chem. B 2005, 109, 13119-13123
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 13119-13123
-
-
Park, J.-I.1
Lee, W.-R.2
Bae, S.-S.3
Kim, Y.J.4
Yoo, K.-H.5
Cheon, J.6
Kim, S.7
-
9
-
-
79956054356
-
-
Loo, Y.-L., Willett, R. L., Baldwin, K. W., and Rogers, J. A. Appl. Phys. Lett. 2002, 81, 562-564
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 562-564
-
-
Loo, Y.-L.1
Willett, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
10
-
-
8644277183
-
-
Felmet, K., Loo, Y.-L., and Sun, Y. Appl. Phys. Lett. 2004, 85, 3316-3318
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 3316-3318
-
-
Felmet, K.1
Loo, Y.-L.2
Sun, Y.3
-
13
-
-
33846455812
-
-
Jeong, U., Teng, X., Wang, Y., Yang, H., and Xia, Y. Adv. Mater. 2007, 19, 33-60
-
(2007)
Adv. Mater.
, vol.19
, pp. 33-60
-
-
Jeong, U.1
Teng, X.2
Wang, Y.3
Yang, H.4
Xia, Y.5
-
14
-
-
3142713138
-
-
Chen, M., Liu, J. P., and Sun, S. J. Am. Chem. Soc. 2004, 126, 8394-8395
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 8394-8395
-
-
Chen, M.1
Liu, J.P.2
Sun, S.3
-
15
-
-
0034677878
-
-
Sun, S., Murray, C. B., Weller, D., Folks, L., and Moser, A. Science 2000, 287, 1989-1992
-
(2000)
Science
, vol.287
, pp. 1989-1992
-
-
Sun, S.1
Murray, C.B.2
Weller, D.3
Folks, L.4
Moser, A.5
-
17
-
-
0000209731
-
-
Ely, T. O., Pan, C., Amiens, C., Chaudret, B., Dassenoy, F., Lecante, P., Casanove, M. J., Mosset, A., Respaud, M., and Broto, J. M. J. Phys. Chem. B 2000, 104, 695-702
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 695-702
-
-
Ely, T.O.1
Pan, C.2
Amiens, C.3
Chaudret, B.4
Dassenoy, F.5
Lecante, P.6
Casanove, M.J.7
Mosset, A.8
Respaud, M.9
Broto, J.M.10
-
18
-
-
0000158969
-
-
Vossmeyer, T., Jia, S., DeIonno, E., Diehl, M. R., Kim, S. H., Peng, X., Alivisatos, A. P., and Heath, J. R. J. Appl. Phys. 1998, 84, 3664-3670
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 3664-3670
-
-
Vossmeyer, T.1
Jia, S.2
Deionno, E.3
Diehl, M.R.4
Kim, S.H.5
Peng, X.6
Alivisatos, A.P.7
Heath, J.R.8
-
19
-
-
2342652309
-
-
Mendes, P. M., Jacke, S., Critchley, K., Plaza, J., Chen, Y., Nikitin, K., Palmer, R. E., Preece, J. A., Evans, S. D., and Fitzmaurice, D. Langmuir 2004, 20, 3766-3768
-
(2004)
Langmuir
, vol.20
, pp. 3766-3768
-
-
Mendes, P.M.1
Jacke, S.2
Critchley, K.3
Plaza, J.4
Chen, Y.5
Nikitin, K.6
Palmer, R.E.7
Preece, J.A.8
Evans, S.D.9
Fitzmaurice, D.10
-
21
-
-
33748573640
-
-
Chen, C.-F., Tzeng, S.-D., Lin, M.-H., and Gwo, S. Langmuir 2006, 22, 7819-7824
-
(2006)
Langmuir
, vol.22
, pp. 7819-7824
-
-
Chen, C.-F.1
Tzeng, S.-D.2
Lin, M.-H.3
Gwo, S.4
-
22
-
-
0031560535
-
-
Heath, J. R., Knobler, C. M., and Leff, D. V. J. Phys. Chem. B 1997, 101, 189-197
-
(1997)
J. Phys. Chem. B
, vol.101
, pp. 189-197
-
-
Heath, J.R.1
Knobler, C.M.2
Leff, D.V.3
-
23
-
-
0035519787
-
-
Huang, S., Tsutsui, G., Sakaue, H., Shingubara, S., and Takahagi, T. J. Vac. Sci. Technol. 2001, 19, 2045-2049
-
(2001)
J. Vac. Sci. Technol.
, vol.19
, pp. 2045-2049
-
-
Huang, S.1
Tsutsui, G.2
Sakaue, H.3
Shingubara, S.4
Takahagi, T.5
-
24
-
-
34247500327
-
-
Li, X., Zhang, L., Wang, X., Shimoyama, I., Sun, X., Seo, W.-S., and Dai, H. J. Am. Chem. Soc. 2007, 129, 4890-4891
-
(2007)
J. Am. Chem. Soc.
, vol.129
, pp. 4890-4891
-
-
Li, X.1
Zhang, L.2
Wang, X.3
Shimoyama, I.4
Sun, X.5
Seo, W.-S.6
Dai, H.7
-
26
-
-
0141510585
-
-
Whang, D., Jin, S., Wu, Y., and Lieber, C. M. Nano Lett. 2003, 3, 1255-1259
-
(2003)
Nano Lett.
, vol.3
, pp. 1255-1259
-
-
Whang, D.1
Jin, S.2
Wu, Y.3
Lieber, C.M.4
-
27
-
-
34447121984
-
-
Tao, A., Sinsermsuksakul, P., and Yang, P. Nat. Nanotechnol. 2007, 2, 435-440
-
(2007)
Nat. Nanotechnol.
, vol.2
, pp. 435-440
-
-
Tao, A.1
Sinsermsuksakul, P.2
Yang, P.3
-
28
-
-
0141454860
-
-
Santhanam, V., Liu, J., Agarwal, R., and Andres, R. P. Langmuir 2003, 19, 7881-7887
-
(2003)
Langmuir
, vol.19
, pp. 7881-7887
-
-
Santhanam, V.1
Liu, J.2
Agarwal, R.3
Andres, R.P.4
-
29
-
-
0031072203
-
-
Xia, Y., McClelland, J. J., Gupta, R., Qin, D., Zhao, X. M., Sohn, L. L., Celotta, R. J., and Whitesides, G. M. Adv. Mater. 1997, 9, 147-149
-
(1997)
Adv. Mater.
, vol.9
, pp. 147-149
-
-
Xia, Y.1
McClelland, J.J.2
Gupta, R.3
Qin, D.4
Zhao, X.M.5
Sohn, L.L.6
Celotta, R.J.7
Whitesides, G.M.8
-
30
-
-
33745713483
-
-
Lee, D. C., Mikulec, F. V., Pelaez, J. M., Koo, B., and Korgel, B. A. J. Phys. Chem. B 2006, 110, 11160-11166
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 11160-11166
-
-
Lee, D.C.1
Mikulec, F.V.2
Pelaez, J.M.3
Koo, B.4
Korgel, B.A.5
-
31
-
-
0037451974
-
-
Wang, W., Gu, B., Liang, L., and Hamilton, W. J. Phys. Chem. B 2003, 107, 3400-3404
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 3400-3404
-
-
Wang, W.1
Gu, B.2
Liang, L.3
Hamilton, W.4
-
33
-
-
0035131680
-
-
Yang, H., Deschatelets, P., Brittain, S. T., and Whitesides, G. M. Adv. Mater. 2001, 13, 54-58
-
(2001)
Adv. Mater.
, vol.13
, pp. 54-58
-
-
Yang, H.1
Deschatelets, P.2
Brittain, S.T.3
Whitesides, G.M.4
-
35
-
-
0035088388
-
-
Huang, S., Tsutsui, G., Sakaue, H., Shingubara, S., and Takahagi, T. J. Vac. Sci. Technol. 2001, 19, 115-120
-
(2001)
J. Vac. Sci. Technol.
, vol.19
, pp. 115-120
-
-
Huang, S.1
Tsutsui, G.2
Sakaue, H.3
Shingubara, S.4
Takahagi, T.5
-
36
-
-
0036684999
-
-
Gruner, S. M., Tate, M. W., and Eikenberry, E. F. Rev. Sci. Instrum. 2002, 73, 2815-2842
-
(2002)
Rev. Sci. Instrum.
, vol.73
, pp. 2815-2842
-
-
Gruner, S.M.1
Tate, M.W.2
Eikenberry, E.F.3
-
38
-
-
84857731833
-
-
i, where a is surface area per particle and π is the surface pressure
-
i, where a is surface area per particle and π is the surface pressure.
-
-
-
-
39
-
-
84857747901
-
-
-1 FePt nanocrystals)
-
-1 FePt nanocrystals).
-
-
-
-
40
-
-
84857777901
-
-
The surface coverage was calculated by taking the area occupied by a hexagonal close-packed film of nanoparticles based on the mass of the sample deposited on the surface of the trough and dividing it by the area of the trough at a given point. The weight of capping ligand was accounted for as well by assuming 80% coverage of the nanoparticle surface. For the case of bare FePt nanocrystals, we assumed a 50/50 coverage of oleic acid and oleylamine. Ligand lengths were based on reported values
-
The surface coverage was calculated by taking the area occupied by a hexagonal close-packed film of nanoparticles based on the mass of the sample deposited on the surface of the trough and dividing it by the area of the trough at a given point. The weight of capping ligand was accounted for as well by assuming 80% coverage of the nanoparticle surface. For the case of bare FePt nanocrystals, we assumed a 50/50 coverage of oleic acid and oleylamine. Ligand lengths were based on reported values.
-
-
-
-
41
-
-
0028468334
-
-
Meldrum, F. C., Kotov, N. A., and Fendler, J. H. Langmuir 1994, 10, 2035-40
-
(1994)
Langmuir
, vol.10
, pp. 2035-40
-
-
Meldrum, F.C.1
Kotov, N.A.2
Fendler, J.H.3
-
42
-
-
84857748357
-
-
Smilgies, D.-M., Busch, P., Posselt, D., and Papadakis, C. M. Synchrotron Radiation News 2002, 15
-
(2002)
Synchrotron Radiation News
, vol.15
-
-
Smilgies, D.-M.1
Busch, P.2
Posselt, D.3
Papadakis, C.M.4
-
43
-
-
33846371974
-
-
Saunders, A. E., Ghezelbash, A., Smilgies, D.-M., Sigman, M. B., and Korgel, B. A. Nano Lett. 2006, 6, 2959-2963
-
(2006)
Nano Lett.
, vol.6
, pp. 2959-2963
-
-
Saunders, A.E.1
Ghezelbash, A.2
Smilgies, D.-M.3
Sigman, M.B.4
Korgel, B.A.5
-
45
-
-
84857744612
-
-
The full width at half-maximum B of the diffraction peaks is related to the crystal domain size L in the Scherrer equation by L = 0.9λ/(B cos θ), where λ is the X-ray wavelength and θ is the diffraction angle
-
The full width at half-maximum B of the diffraction peaks is related to the crystal domain size L in the Scherrer equation by L = 0.9λ/(B cos θ), where λ is the X-ray wavelength and θ is the diffraction angle.
-
-
-
-
46
-
-
33947531699
-
-
Hyun, C., Lee, D. C., Korgel, B. A., and de Lozanne, A. Nanotechnology 2007, 18, 055704
-
(2007)
Nanotechnology
, vol.18
, pp. 055704
-
-
Hyun, C.1
Lee, D.C.2
Korgel, B.A.3
De Lozanne, A.4
-
47
-
-
67249112607
-
-
Kweon, S., Samarth, N., and Lozanne, A. d. J. Appl. Phys. 2009, 105, 093906
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 093906
-
-
Kweon, S.1
Samarth, N.2
Lozanne, A.D.3
-
48
-
-
84857733586
-
-
The areal Bohr magneton density is estimated from the magnetization measured at 300 K. The number of particles per area was calculated by assuming an HCP monolayer of nanoparticles
-
The areal Bohr magneton density is estimated from the magnetization measured at 300 K. The number of particles per area was calculated by assuming an HCP monolayer of nanoparticles.
-
-
-
|