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Journal of Applied Physics

Volumn 105, Issue 9, 2009, Pages

Scanning Hall probe microscopy of a diluted magnetic semiconductor

(3) Kweon, Seongsoo a Samarth, Nitin b,c De Lozanne, Alex a

a UNIVERSITY OF TEXAS AT AUSTIN (United States)

b PENNSYLVANIA STATE UNIVERSITY (United States)

c Dongbu HiTek Co Ltd (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FIELD; DESIGN PHILOSOPHY; DILUTED MAGNETIC SEMICONDUCTORS; MAGNETIC CLUSTER; MICROMAGNETIC PROPERTIES; SCANNING HALL PROBE MICROSCOPY; SCANNING HALL PROBES; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE;

CRYSTAL GROWTH; MAGNETIC SEMICONDUCTORS; MANGANESE; MANGANESE COMPOUNDS; MOLECULAR BEAMS; MOLECULAR DYNAMICS; PHILOSOPHICAL ASPECTS; PROBES; QUANTUM INTERFERENCE DEVICES; SCANNING; SUPERCONDUCTING MAGNETS;

MAGNETIC DOMAINS;

EID: 67249112607 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3122145 Document Type: Article

Times cited : (3)

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