Noise characterization in millimeter sized micromanipulation systems

Mechatronics

Volumn 21, Issue 6, 2011, Pages 1087-1097

  Boudaoud, M ^a   Haddab, Y ^a   Le Gorrec, Y ^a   Lutz, P ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

Characterization of noise sources; Environmental noise; Finite difference modeling; Micromanipulation systems; Nanometer vibrations

Indexed keywords

ACTIVE NOISE CONTROL; DYNAMIC MODELS; END EFFECTORS; FINITE DIFFERENCE METHOD; INTERFEROMETERS; LASER INTERFEROMETRY; MICROMANIPULATORS; MICROMETERS; NANOCANTILEVERS;

ENVIRONMENTAL NOISE; FINITE DIFFERENCE MODEL; MICRO MANIPULATION SYSTEMS; NANOMETER VIBRATIONS; NOISE SOURCE;

ACOUSTIC NOISE;

EID: 80052767841     PISSN: 09574158     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechatronics.2011.06.005     Document Type: Article

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