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Volumn 106, Issue 9, 2009, Pages

Direct measurement of spatial modes of a microcantilever from thermal noise

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS;

EID: 70450230372     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3245394     Document Type: Article
Times cited : (26)

References (21)
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    • Measuring the spring constant of atomic force microscope cantilevers: Thermal fluctuations and other methods
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    • Differential interferometry with a complex contrast
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    • L. Bellon, S. Ciliberto, H. Boubaker, and L. Guyon, Opt. Commun. 0030-4018 207, 49 (2002). 10.1016/S0030-4018(02)01475-X (Pubitemid 34623972)
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    • Bellon, L.1    Ciliberto, S.2    Boubaker, H.3    Guyon, L.4
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    • J. E. Sader, J. Appl. Phys. 0021-8979 84, 64 (1998). 10.1063/1.368002
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.