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Volumn 22, Issue 38, 2011, Pages

A precise optical determination of nanoscale diameters of semiconductor nanowires

Author keywords

[No Author keywords available]

Indexed keywords

DARK FIELD; DARK FIELD MICROSCOPY; DEVICE INTEGRATION; ELASTIC SCATTERING PROPERTIES; ELECTRICAL AND OPTICAL PROPERTIES; GAAS; GROWTH CONDITIONS; MIE CALCULATIONS; MIE RESONANCE; NANO SCALE; OPTICAL DETERMINATION; OPTICAL METHODS; OPTICAL SCATTERING; PHYSICAL PRINCIPLES; RELATIVE ERRORS; SEMICONDUCTING NANOWIRES; SEMICONDUCTOR NANOWIRE; STANDARD HARDWARE; VACUUM TECHNIQUES; VISIBLE COLOR CHANGES;

EID: 80052184986     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/38/385201     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.