SCOPUS 정보 검색 플랫폼

Materials Science and Engineering: B

Volumn 80, Issue 1-3, 2001, Pages 99-103

Kinetics of native oxide film growth on epiready GaAs

(3) Tanner, B K a Allwood, D A b Mason, N J b

a DURHAM UNIVERSITY (United Kingdom)

b UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

GaAs wafers; Kinetics; Native oxide; X ray reflectivity

Indexed keywords

CHEMICAL POLISHING; COMPUTER SIMULATION; LIGHT ABSORPTION; LIGHT REFLECTION; METALLORGANIC VAPOR PHASE EPITAXY; REACTION KINETICS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH;

GRAZING INCIDENCE X RAY REFLECTIVITY; SURFACE PHOTOABSORPTION;

SEMICONDUCTING FILMS;

EID: 0035932251 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(00)00622-X Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.