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Volumn 158, Issue 10, 2011, Pages

Improvement of (11-22) GaN on m-plane sapphire with CrN interlayer by using molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

BASAL STACKING FAULTS; CRYSTALLINE QUALITY; DEFECT-RELATED EMISSION; EMISSION PEAKS; LOW TEMPERATURES; M-PLANE; NEAR BAND EDGE; PL MEASUREMENTS; PL SPECTRA; TEMPERATURE DEPENDENT; THREADING DISLOCATION; X-RAY DIFFRACTION SYSTEM;

EID: 80052099619     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3615957     Document Type: Article
Times cited : (11)

References (20)
  • 7
    • 17944381225 scopus 로고    scopus 로고
    • Polarization anisotropy in the electroluminescence of m-plane InGaN-GaN multiple-quantum-well light-emitting diodes
    • DOI 10.1063/1.1875765, 111101
    • N. F. Gardner, J. C. Kim, J. J. Wierer, Y. C. Shen, and M. R. Krames, Appl. Phys. Lett., 86, 111101 (2005). 10.1063/1.1875765 (Pubitemid 40596970)
    • (2005) Applied Physics Letters , vol.86 , Issue.11 , pp. 1-3
    • Gardner, N.F.1    Kim, J.C.2    Wierer, J.J.3    Shen, Y.C.4    Krames, M.R.5
  • 15
    • 33847094173 scopus 로고    scopus 로고
    • M -plane GaN layers grown by rf-plasma assisted molecular beam epitaxy with varying GaN flux ratios on m -plane 4H-SiC substrates
    • DOI 10.1063/1.2435806
    • R. Armitage, M. Horita, J. Suda, and T. Kimito, J. Appl. Phys., 101, 033534 (2007). 10.1063/1.2435806 (Pubitemid 46280867)
    • (2007) Journal of Applied Physics , vol.101 , Issue.3 , pp. 033534
    • Armitage, R.1    Horita, M.2    Suda, J.3    Kimoto, T.4
  • 20
    • 0035886060 scopus 로고    scopus 로고
    • 10.1063/1.1402147
    • R. Pssler, J. Appl. Phys., 90, 3956 (2001). 10.1063/1.1402147
    • (2001) J. Appl. Phys. , vol.90 , pp. 3956
    • Pssler, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.